The Semiconductor Module menu in the TestStand Sequence Editor contains the following items:

  • Edit Test Program: <filename>—Launches the Test Program Editor, in which you can edit the test program settings for the active sequence file.
  • Edit Pin Map File—Opens the pin map file associated with the active sequence file in the Pin Map Editor.
  • Edit Bin Definitions File—Opens the bin definitions file associated with the active sequence file in the Bin Definitions Editor.
  • Create Test Program from Digital Pattern Project—Launches the Create Test Program from Digital Pattern Project dialog box from which you can create a basic test program that initializes sessions for NI-Digital and NI-DCPower instruments and bursts the patterns defined in the digital pattern project.
  • Configure Station—Launches the Configure Station Settings dialog box.
  • Configure Lot—Launches the Configure Lot Settings dialog box.
  • Import Test Limits into <filename>—ImportsSemiconductor Multi Test step test data into the active sequence file from an external test data file.
  • Export Test Limits from <filename>—ExportsSemiconductor Multi Test step test data from the active sequence file to an external test data file.
  • Export Correlation Offset Template file based on <filename>—Generates a tab-delimited correlation offsets template file based on the numerical limit tests in the selected sequence file.
  • Show Lot Statistics Viewer—Opens the Lot Statistics Viewer window, in which you can control execution and view lot statistics while debugging a sequence.
  • Show Runtime Data Viewer—Opens the Runtime Data Viewer window, in which you can see test results and debug issues at runtime.
  • Launch InstrumentStudio—Launches InstrumentStudio, which is a pin- and site-aware, software-based front panel application you can use to monitor, control, and record measurements from supported devices.
    Note If you launch InstrumentStudio in any other way, such as from the Microsoft Windows Start menu, InstrumentStudio is not pin and site aware.
  • Launch Digital Pattern Editor—Launches the Digital Pattern Editor and opens the digital pattern project file, if any, associated with the active sequence file.
  • Custom Instrument Panels—Displays and launches available custom pin- and site-aware instrument panels you can use to debug instruments during test program execution at a breakpoint.
  • Measure Performance of <filename>—Launches the Test Program Performance Measurement Configuration dialog box, in which you can specify settings to execute and measure test program performance.
  • Launch Test Program Performance Analyzer—Launches the Test Program Performance Analyzer so you can view data TSM generates when you measure the performance of a test program.
  • Enable/Disable Offline Mode—Enables and disables Offline Mode, which allows you to develop, run, and debug test programs only on a computer without access to NI instruments.
  • Disable/Enable Semiconductor Module—Disables and enables TSM and removes TSM type palettes and process model plug-ins.
  • About TestStand Semiconductor Module—Displays version information for TSM.