Use the Semiconductor Multi Test step to evaluate one or more parametric or functional tests for the DUT. A single Semiconductor Multi Test step can specify multiple parametric or functional tests. You can configure multisite, binning, and per-site input options directly on the step.

Note You cannot use multiple Semiconductor Multi Test steps or Semiconductor Action steps configured to use multiple threads in While loops, in Do While loops, or in For loops that use the Custom Loop option when performing multisite testing. The steps report a run-time error in these situations. Use other types of loops instead, such as For loops that use the Fixed Number of Iterations option.

Configuring the Step

You can configure a single Semiconductor Multi Test step test to evaluate a Boolean or numeric measurement against specified limits. Each numeric limit test can have independent limits, base units, comparison type, and software bin. Configure each measurement the same way you configure an individual Numeric Limit Test step. A Semiconductor Multi Test step passes when none of the specified tests fail.

Use the Semiconductor Multi Test step edit tabs in the TestStand Sequence Editor to specify the tests, comparison, limits, multisite, binning, and per-site input options.

Step Properties

The Semiconductor Multi Test step type defines a set of step properties and constants, in addition to the built-in properties common to all TestStand steps.