Select Semiconductor Module » Edit Test Program: <filename> or click the Edit Test Program: <filename> button on the TSM toolbar to launch the Test Program Editor for the sequence file. Use this dialog box to specify the pin map and bin definitions files, create and edit test program configurations, and configure other settings for the test program.

The Test Program Editor contains the following panels:

  • Pin Map—Specifies the path of the pin map file.
  • Bin Definitions—Specifies the path of the bin definitions file.
  • Digital Pattern Project—Specifies the path of the digital pattern project file.
  • Offline Mode—Specifies the path of the Offline Mode system configuration file you want to associate with the test program.
  • InstrumentStudio Project—Specifies the path of the InstrumentStudio project file.
  • LabVIEW Project—Specifies the path of the LabVIEW project file.
  • Specifications Files—Specifies a list of specifications file references available for use in the test program.
  • PAT Algorithm Settings—Specifies values for the part average testing (PAT) algorithm settings for the test program.
  • Test Limits Files—Specifies a list of test limits file references available for use in the test program. Each test program configuration can specify a test limits file to load when test program execution begins.
  • Alarms— Specifies how alarms are handled on a per-alarm and per-pin basis.
  • Configuration Definition—Specifies a table of standard and custom test conditions available for use in the test program. Each test program configuration can specify a value for the test conditions.
  • Configurations—Specifies a list of configurations available for use in the test program.
  • Configuration Panels—Specifies test condition values and test limits file for the configuration.