Select Semiconductor Module»Create Test Program from Digital Pattern Project to launch the Create Test Program from Digital Pattern Project dialog box. Use this dialog box to create a basic test program with a structure for initializing sessions for NI-Digital and NI-DCPower instruments and bursting the patterns defined in the digital pattern project. Use this basic test program as a starting point to build a more comprehensive test program.

The Create Test Program from Digital Pattern Project dialog box contains the following options:

  • Source Digital Pattern Project File Path—Specifies the digital pattern project file from which you want to create a test program.
  • Target Test Program Directory Path—Specifies the directory in which you want to create the test program from the digital pattern project.
  • Errors and warnings (optional output)—Displays errors and warnings. You must resolve errors before you can create the test program.

The generated test program for a digital pattern project consists of the following components:

  • Sequence File—Implements the test program for the digital pattern project. The test program defines the three sequences described below. For each sequence, replace the placeholder labels with an implementation from your measurement library or a step template provided by another add-on.
    • ProcessSetup—Use this sequence to initialize sessions for NI-Digital and NI-DCPower instruments defined in the active pin map file of the digital pattern project. Sessions for NI-Digital should use the active pin levels sheet and the active timing sheet of the digital pattern project.

      This sequence uses the NI-DCPower Initialize Step (TSM) to initialize NI-DCPower instrument sessions and the NI-Digital Pattern Initialize Step (TSM) to initialize NI-Digital instrument sessions.

    • MainSequence—Use this sequence to burst the patterns defined in the digital pattern project and optionally capture waveforms.
    • ProcessCleanup—Use this sequence to close sessions for NI-Digital and NI-DCPower instruments defined in the active pin map file of the digital pattern project.
  • Supporting Materials—Contains the following files and subdirectories:
    • A copy of the source digital pattern project file
    • Bin Definitions—Contains the default bin definitions.
    • Pin Maps—Contains copies of pin map files from the source digital pattern project.
    • Specifications—Contains specification files.
    • Digital—Contains copies of data files for digital tests from the source digital pattern project, including the following files:
      • Pattern files
      • Timing files
      • Levels files
      • Source and capture waveform files
    • Offline Mode Configurations—Defines an Offline Mode System Configuration that includes the NI-Digital and NI-DCPower instruments in the pin map file. Use this file to simulate the instruments needed by the test program in Offline Mode.

      Ensure instruments in the pin map file follow the recommended instrument naming convention for semiconductor test programs:

      InstrumentType_ModelNumber_PXIChassisLocation_SlotLocation, for example, HSD_657x_C2_S03, where InstrumentType is an ASCII description of the instrument, ModelNumber is the model number as defined on ni.com, PXIChassisLocation uses a single digit to identify the PXI chassis (Cx), and SlotLocation uses double digits to identify the slot location (Sxx).

To find the digital pattern project for the test program, select Semiconductor Module»Edit Test Program... then select Digital Pattern Project.