Specifying Settings for the Current Lot under Test (TSM)

The production operator can specify the following information for the current lot of DUTs (test lot):

• Historical information, such as the wafer lot from which the DUTs came
• Descriptive information, such as DUT numbers or package types
• Conditions under which to test the DUTs, such as temperature, voltage, and so on

The test program can use lot information to determine how to execute tests. For example, lot settings might dictate which steps execute, what temperature to apply to a DUT, what voltage to use, and so on.

TSM Implementation

The NI_SemiconductorModule_LotSettings data type includes properties that correspond to some fields of the Master Information Record (MIR) of version 4 of the Standard Test Data Format (STDF) and includes other properties specific to TSM. You can access the lot settings from the test program, and you can modify the default TSM lot settings callbacks to customize how TSM obtains the settings.

The Configure Lot button in the default TSM operator interface, the Semiconductor Module » Configure Lot menu item in the TestStand Sequence Editor, and the Configure Lot button on the TSM toolbar call the ConfigureLotSettings callback sequence to obtain the settings for the current test lot. Use the ConfigureLotSettings callback sequence to prompt an operator to manually enter lot information in the Configure Lot Settings dialog box or to use another mechanism that requires user input.