Getting Started with TSM
- Updated2025-06-26
- 4 minute(s) read
Use TestStand and TSM with other NI development tools to build, debug, customize, and deploy semiconductor characterization and production test systems.
Brief Tour of TSM
- From the TestStand Sequence Editor, open Getting Started with Semiconductor
Module.seq.
Open the file from the <TestStand Public>\Examples\NI_SemiconductorModule\Getting Started with Semiconductor Module\LabVIEW directory.
The Getting Started with Semiconductor Module.seq sequence file is a simple example semiconductor test program that demonstrates a multisite test program that uses LabVIEW code modules with simulated test results. The example is configured to test up to four DUTs in parallel, each on a separate test site.
- Review the following TSM toolbar
buttons to use to control execution and view lot statistics while executing and
debugging a sequence.
1. Edit Test Program 8. Export Test Limits from 15. Step Over 2. Edit Pin Map File 9. Single Test 16. Step Out 3. Edit Bin Definitions File 10. Start/Resume Lot 17. Show Lot Statistics Viewer 4. Configure Station 11. Pause 18. Launch Digital Pattern Editor 5. Configure Lot 12. Retest 19. Launch InstrumentStudio 6. Active Configuration 13. End Lot 20. Enable/Disable Offline Mode 7. Import Test Limits into 14. Step Into - Click the Start/Resume Lot button
to begin testing. Each Execution window represents a test site. The sequence editor traces each step during execution.
Note Depending on the current sequence editor settings, when you click the Start/Resume Lot button, TestStand might display the Found Analysis Errors dialog box to indicate that errors exist in the sequence file. Click the Continue Execution button to ignore these errors because the sequence file adjusts certain settings at run time to fix these errors. - Click the Show Lot Statistics Viewer
button to view per-site binning information. The Lot Statistics Viewer window includes the same buttons as on the TSM toolbar for controlling execution.
- Click the End Lot button
to stop testing.
- Close the Lot Statistics Viewer window.
- Press <Ctrl-D> to close the Execution windows.
Debugging LabVIEW Steps
- In the Getting Started with Semiconductor Module.seq, click in the
blank column to the left of the Leakage step to set a breakpoint
.
- Click the Start/Resume Lot button to begin testing. Each Execution window pauses when it reaches the breakpoint at the Leakage step. The background color of the Execution window changes to yellow to indicate that the execution is paused.
- Click the Step Into button
on the TSM toolbar to transfer execution to the LabVIEW Development System, which suspends within the Leakage VI the Leakage step calls. You can now use the built-in LabVIEW debugging tools.
- In LabVIEW, click the Run button
and then click the Return to Caller button
to return execution to the sequence editor.
- Click the End Lot button to stop testing.
- Explore the components of a test program.
- Complete the Exploring a Basic Semiconductor Test Program with LabVIEW or .NET tutorial.
- Review the Accelerometer with LabVIEW or .NET example, located in the <TestStand Public>\Examples\NI_SemiconductorModule\Accelerometer directory.
- Use the TestStand and TSM example programs, located in the <TestStand Public>\Examples directory, as a starting point for applications you create.
- Refer to the NI STS Technical Support Community on ni.com for information about TSM custom instruments for instrument drivers, custom debug panels, and custom handler/prober drivers. You can work directly with NI services personnel contracted on your project or contact stssupport@ni.com to request to be added to the NI STS Technical Support Community.
Related Information
- TestStand Directory Structure
- Semiconductor Module Toolbar Buttons
- Lot Statistics Viewer (TSM)
- Overview of Test Program Components
A semiconductor test program can include a pin map file, a main sequence file, subordinate sequence files, code modules, specifications, timing files, levels files, pattern files, source and capture waveforms, test limits files, a bin definitions file, and configurations.
- Tutorial: Exploring a Basic Semiconductor Test Program with LabVIEW
Open an existing sequence file and configure it to create a basic semiconductor test program with LabVIEW.
- Tutorial: Exploring a Basic Semiconductor Test Program with .NET
Open an existing sequence file and configure it to create a basic semiconductor test program with .NET.
- Accelerometer with LabVIEW
This example demonstrates several features of TSM in a test program that makes common measurements with the NI-Digital Pattern driver to test an imagined accelerometer part. You can use this example as a starting point for your test programs.
- Accelerometer with .NET
This example demonstrates several features of TSM in a test program that makes common measurements with the NI-Digital Pattern driver to test an imagined accelerometer part. You can use this example as a starting point for your test programs.