You can apply correlation offset values to test results on a per-site basis at run time before evaluating the test result data against limits. Use the Load Correlation Offsets Step and associated edit tab to load and apply a correlation offset file.

Select Semiconductor Module » Export Correlation Offset Template file based on <filename> to generate a tab-delimited correlation offsets template file (.txt) based on the numerical limit tests in the selected sequence file. If you make changes, export the file again, and select an existing file, the content of the existing file is overwritten, including any custom correlation offset values you set.

The correlation offsets template file contains entries (0.0) for all numerical limits tests for all defined sites in the sequence file. You can use the template file as a starting point for a custom correlation offsets file.

The file does not contain correlation offsets entries for external sequence files referenced in the sequence file from which you export the correlation offsets template file.

The correlation offsets template file contains the following test data for every sequence in the sequence file:

Data Item Description
SequenceName Always included in the file.
StepName Always included in the file.
StepId Always included in the file.
TestNumber Always included in the file. If a step does not contain any tests, this field displays "No Tests".
Site_0_Offset to Site_n_Offset n is the number of sites defined for the station. If no sites are defined, only Site_0_Offset will exist. The default value is 0.0. You do not have to assign a custom correlation offset value to every test in the file.