Use a tab-delimited text file to export and import test limits from and to Semiconductor Multi Test steps and Semiconductor Sequence Call steps in a single sequence file at edit time or run time. During development, export all the tests in a test program to review and edit and then import the changes back into the test program. At run time, load and execute a different set of test limits from separate text files based on the test program configuration you select by exporting the test limits and creating multiple copies of the file to edit for each unique set of test limits you want to use. To protect the test limits files from viewing or editing when deploying a test program, embed the test limits in the test program sequence file and use the TestStand password protection option to lock the sequence file.

Select Semiconductor Module » Edit Test Program and select Test Limits Files in the Test Program Editor to specify one or more test limits files to make available to the test program configurations. The test program configuration specifies the test limits file that loads before running a test lot.

Create a test limits file by selecting Semiconductor Module » Export Test Limits from or by clicking the Export Test Limits from button on the TSM toolbar to export test limits from a sequence file into a tab-delimited test limits text file. Import a test limits file by selecting Semiconductor Module » Import Test Limits to or by clicking the Import Test Limits to button on the TSM toolbar to import test limits from a tab-delimited test limits text file into a sequence file. When you assign a base limits file for a test program, importing a test limits file will automatically merge the values of the file with the values of the base file, overriding or inheriting values accordingly. TSM imports the merged value. When you import test limits from a text file, you can update limits in matching tests or replace all tests in matching steps.