This example demonstrates how to address several multisite use cases.

Example File Locations <TestStand Public>\Examples\NI_SemiconductorModule\Multisite Programming Scenarios\LabVIEW\MultisiteScenarios.seq
Highlighted Features Testing Multiple Sites in Parallel
Major API

TSM Code Module API

Prerequisites
  • You must have the LabVIEW Development System installed, and you must configure the LabVIEW Adapter to use the LabVIEW Development System.
  • This example uses the Batch process model.

Complete the following steps to use this example.

  1. Open <TestStand Public>\Examples\NI_SemiconductorModule\Multisite Programming Scenarios\LabVIEW\MultisiteScenarios.seq.
  2. Review the following steps and corresponding code modules:
    • Simple Parametric Measurement
    • Query Pin/Site Measurement for Unsupported Measurement Type
    • Source-Wait-Measure Parametric Test
    • Source Power Supply Pins and Measure Digital Pins
    • Multiple Measurements on Multiple Pins
    • Source All Digital Pins, Source-Wait-Measure Each Digital Pin
    • Functional Test Using NI-Digital Pattern Driver
    • Functional Test for Multiple Registers Using NI-Digital Pattern Driver
    • Functional Test Using NI-HSDIO Hardware Compare
    • Functional Test for Multiple Registers
    • Instrument Multiplexed Across Sites
    • Instrument Multiplexed Across Sites, Multiple Measurements