Functional Test for Multiple Registers Using NI-HSDIO (TSM)

The following figure shows how to read multiple register values from a digital waveform.

This example includes the following main tasks:

1. Query for the sessions for the digital I/O pins.
2. Use a parallel For Loop to fetch the digital waveforms.
3. Rearrange the digital waveforms from per-instrument waveforms to per-site waveforms.
4. Use a For Loop to scan each per-site waveform to obtain register values for four addresses.
5. Transpose the 2D array so that the first dimension corresponds to sites.
6. Use a site-based instance of the Publish Data VI to publish the register value using the address as a hex string for the Published Data Id.

The Semiconductor Multi Test step that calls the code module shown above contains the following tests, where each test evaluates one numeric value per register, as shown in the following figure: