Functional Test Using NI-Digital Pattern Driver (TSM)
- Updated2025-04-10
- 1 minute(s) read
The following figure shows how to use the Digital Pattern Instrument for a multisite functional test.
This example includes the following main tasks:
- Query for the sessions for the digital I/O pins under test.
- Use a parallel For Loop to iterate on every required instrument to burst a pattern.
- Use the Publish Pattern Results VI to publish per-site Boolean results from the pattern burst.
The Semiconductor Multi Test step that calls the code module shown above contains the following test, which evaluates one Boolean result, as shown in the following figure:
