The following figure shows how to take multiple measurements on multiple pins.



This example includes the following main tasks:

  1. Query for the sessions for the pins.
  2. Use a For Loop to iterate on the different measurement conditions.
  3. For each condition, use a parallel For Loop to iterate on every instrument you need to call to take the measurement on all pins in all sites.
  4. For each condition, use the original Pin Query Context and a unique Published Data Id with a pin-based instance of the Publish Data VI to publish the measurement for each condition. You do not need to query for sessions inside the For Loop because multiple queries will return the same sessions. You can use the same Pin Query Context to publish multiple times as long as the Published Data Id is unique.
  5. Probe the measurement value for every pin and site combination. The source code for the probe is in the Probe Pin Site Data VI.

The Semiconductor Multi Test step that calls the code module shown above contains the following tests, where each test evaluates one measurement for each digital I/O pin and each unique Published Data Id, as shown in the following figure: