The following figure shows how to source a voltage on the test pin(s), wait for the voltage to settle, and take a measurement.



This example includes the following main tasks:

  1. Query for the sessions for the pin(s) to source and measure.
  2. Use a parallel For Loop to iterate on every instrument you need to call to source a value on the test pin(s).
  3. Wait for the voltage to settle on all pins and on all sites.
  4. Use a parallel For Loop to iterate on every instrument you need to call to take the multisite measurement.
  5. Use the Pin Query Context with a pin-based instance of the Publish Data VI to publish the measurement.

The Semiconductor Multi Test step that calls the code module shown above contains the following tests, where each test evaluates one measurement for each pin, as shown in the following figure: