Select Semiconductor Module » Export Test Limits from <filename> to export test limits from all test steps in a sequence file to a new or existing tab-delimited test limits text file at edit time. Selecting an existing file overwrites the content of the file.

When you export test limits, the text file includes the following test data for every sequence in the sequence file:

• Sequence name, Step name, UniqueStepId, Test name— Always included.
• Test number— If a step does not contain any tests, this field displays No Tests.
  Note Use the Semiconductor Action step instead of the Semiconductor Multi Test step if the step does not contain any tests.
• Pin or pin group—TSM does not export the test data associated with the generated tests for the pins in the pin group.
• Low limit expression, High limit expression—For Pass/Fail tests, these fields are blank.
• Scaling factor—Included only when non-empty scaling factors exist for any test in the sequence file and scaling factors are the same within each test. The Units Prefix column of the Supported Scaling factors table lists values for exported scaling factors.
• Low limit scaling factor, High limit scaling factor, Data limit scaling factor—Included only when non-empty for any test in the sequence file and the data and limits scaling factors differ in at least one test in the sequence file. The Units Prefix column of the Supported Scaling Factors table lists values for exported scaling factors.
• Evaluation comparison mode—Included only when at least one step contains non-default value. For Pass/Fail tests, this field is blank.
• Base units—For Pass/Fail tests, this field is blank.
• Evaluation type, Software bin— Always included.
• Test name expression, Test number expression, Software bin expression, Published data ID, Test data source expression, Export data to expression—Included only when non-empty values exist for any tests in the sequence file.
• Test numeric display format—Included only when non-default test numeric display formats exist for any tests in the sequence file.
• PAT base test number—Included only when non-empty PAT base test numbers exist for any tests in the sequence file. A blank value is exported for a test when the Enable Dynamic PAT and Enable Static PAT columns on the Semiconductor Multi Test Part Average Testing (PAT) tab do not include a checkmark for the test.
• Enable dynamic PAT—Included only when the Enable Dynamic PAT column on the Semiconductor Multi Test Part Average Testing tab includes a checkmark in the sequence file.
• Dynamic PAT test number, Dynamic PAT test name, Dynamic PAT software bin, Dynamic PAT low limit, Dynamic PAT high limit—Included only when non-empty values exist for any tests in the sequence file. A blank value is exported for a test when the Enable Dynamic PAT column on the Semiconductor Multi Test Part Average Testing tab does not include a checkmark for the test.
• Enable static PAT—Included only when the Enable Static PAT column on the Semiconductor Multi Test Part Average Testing tab includes a checkmark in the sequence file.
• Static PAT test number, Static PAT test name, Static PAT software bin—Included only when non-empty values exist for any tests in the sequence file. A blank value is exported for a test when the Enable Static PAT column on the Semiconductor Multi Test Part Average Testing tab does not include a checkmark for the test.

The file does not contain test data for external sequence files referenced in the sequence file from which you export the test limits.