Each row in the test limits file corresponds to a test. The import mode and the columns in the test limits file define how the Import/Export Test Limits tool matches rows to the sequence file.

Tags enclosed in angle brackets denote the properties recognized during import or export. The Import/Export Test Limits tool ignores any column with an unknown tag and any text above or on the same line as the opening <SemiconductorModuleTests> tag or below or on the same line as the required closing </SemiconductorModuleTests> tag. For properties that are overridable, a row in a test limits file may include a value that overrides the value of the same test in the base test limits file of the test program, or the value may be the special token <inherit> to use the value specified in the base test limits file. You can place comments above the <SemiconductorModuleTests> tag, below the </SemiconductorModuleTests> tag, or to the right of the recognized data columns, as shown in the following table:

Column Tag Description Format Overridable?
<SequenceName> Name of the sequence. The tool uses this column, if present, to match each row in the test limits file to locations in the sequence file. String N/A
<StepName> Name of the step. The tool uses this column, if present, to match each row in the test limits file to locations in the sequence file. String N/A
<StepId> Unique ID of the step automatically generated by TestStand. The tool uses this column, if present, to match each row in the test limits file to locations in the sequence file. String N/A
<TestName> Name of the test. String N/A
<TestNumber> Number of the test. Importing an empty string indicates the lack of a test number. When you enable the Update limits in matching tests option, the tool uses this column, if present, to match each row in the test limits file to locations in the sequence file. If a step does not contain any tests, this field displays No Tests.
Note Use the Semiconductor Action step instead of the Semiconductor Multi Test step if the step does not contain any tests.
 Number N/A
<Pin> Name of the pin or pin group. For a pin group, test data for individual pins in the pin group are not included in the file. String Yes
<LowLimitExpression> Lower limit expression. Blank for Pass/Fail tests. String Yes
<HighLimitExpression> Upper limit expression. Blank for Pass/Fail tests. String Yes
<ScalingFactor> Scaling factor used to display the data, high limit, and low limit fields. The Units Prefix column of the Supported Scaling Factors table lists valid values for scaling factors.
Note If you use the <ScalingFactor> column, you cannot use the individual field <LowLimitScalingFactor>, <HighLimitScalingFactor>, and <DataScalingFactor> columns.
 String No
<LowLimitScalingFactor> Scaling factor used to display the low limit field. The Units Prefix column of the Supported Scaling Factors table lists valid values for scaling factors. String No
<HighLimitScalingFactor> Scaling factor used to display the high limit field. The Units Prefix column of the Supported Scaling Factors table lists valid values for scaling factors. String No
<DataScalingFactor> Scaling factor used to display the data field. The Units Prefix column of the Supported Scaling Factors table lists valid values for scaling factors. String No
<ComparisonType> Evaluation Comparison Mode. Included in file only when property contains non-default value. Blank for Pass/Fail tests. String Yes
<Units> Base units of the limits. Blank for Pass/Fail tests. String No
<EvaluationType> Evaluation type. Valid values are Pass/Fail or Numeric Limit. String Yes
<FailBin> Software Bin. Number Yes
<TestNameExpression> Test name expression. Included in file only when non-empty test name expressions exist in the sequence file. String Yes
<TestNumberExpression> Test number expression. Included in file only when non-empty test number expressions exist in sequence file. String Yes
<FailBinExpression> Software bin expression. Included in file only when non-empty software bin expressions exist in sequence file. String Yes
<PublishedDataId> Published data ID. Included in file only when non-empty published data IDs exist in the sequence file. String Yes
<TestDataSource> Test data source expression. Included in file only when non-empty test data source expressions exist in the sequence file. String Yes
<ExportLocation> Expression for location to which to export data (Export Data To column in the Tests table). Included in file only when non-empty export data to expressions exist in the sequence file. String Yes
<NumericFormat> Test numeric display format that applies to the high limit, low limit, and data. During export, TSM retrieves the value from the Data property of the test. Included in file only when non-default numeric formats exist for any tests in the sequence file. String Yes
<PAT_BaseTestNumber> Base test number for PAT tests. Included in file only when non-empty PAT base test numbers exist in the sequence file. A blank value is exported for a test when the Enable Dynamic PAT and Enable Static PAT columns on the Semiconductor Multi Test Part Average Testing (PAT) tab do not include a checkmark for the test. Number Yes
<DynamicPAT_Enabled> Enables dynamic PAT. Included in file only when the Enable Dynamic PAT column on the Semiconductor Multi Test Part Average Testing tab includes a checkmark in the sequence file. Boolean Yes
<DynamicPAT_TestNumber> Number of the dynamic PAT test. Included in file only when non-empty dynamic PAT test numbers exist in the sequence file. A blank value is exported for a test when the Enable Dynamic PAT column on the Semiconductor Multi Test Part Average Testing tab does not include a checkmark for the test. Number Yes
<DynamicPAT_TestName> Name of the dynamic PAT test. Included in file only when non-empty dynamic PAT test names exist in the sequence file. A blank value is exported for a test when the Enable Dynamic PAT column on the Semiconductor Multi Test Part Average Testing tab does not include a checkmark for the test. String Yes
<DynamicPAT_FailBin> Dynamic PAT software bin. Included in file only when non-empty dynamic PAT software bins exist in the sequence file. A blank value is exported for a test when the Enable Dynamic PAT column on the Semiconductor Multi Test Part Average Testing tab does not include a checkmark for the test. Number Yes
<DynamicPAT_LowLimit> Dynamic PAT lower limit. Included in file only when non-empty dynamic PAT low limits exist in the sequence file. A blank value is exported for a test when the Enable Dynamic PAT column on the Semiconductor Multi Test Part Average Testing tab does not include a checkmark for the test. Number Yes
<DynamicPAT_HighLimit> Dynamic PAT higher limit. Included in file only when non-empty dynamic PAT high limits exist in the sequence file. A blank value is exported for a test when the Enable Dynamic PAT column on the Semiconductor Multi Test Part Average Testing tab does not include a checkmark for the test. Number Yes
<StaticPAT_Enabled> Enables static PAT. Included in file only when the Enable Static PAT column on the Semiconductor Multi Test Part Average Testing tab includes a checkmark in the sequence file. Boolean Yes
<StaticPAT_TestNumber> Number of the static PAT test. Included in file only when non-empty static PAT test numbers in the sequence file. A blank value is exported for a test when the Enable Static PAT column on the Semiconductor Multi Test Part Average Testing tab does not include a checkmark for the test. Number Yes
<StaticPAT_TestName> Name of the static PAT test. Included in file only when non-empty static PAT test names exist in the sequence file. A blank value is exported for a test when the Enable Static PAT column on the Semiconductor Multi Test Part Average Testing tab does not include a checkmark for the test. String Yes
<StaticPAT_FailBin> Static PAT software bin. Included in file only when non-empty static PAT software bins exist in the sequence file. A blank value is exported for a test when the Enable Static PAT column on the Semiconductor Multi Test Part Average Testing tab does not include a checkmark for the test. Number Yes
Note Exporting PAT limits does not honor settings you specify in the StepSettingsPaneUI property of the FileGlobals.PartAverageTestingAlgorithmDescription.EnvironmentSettings container of the PartAverageTestingCallbacks.seq file.