Semiconductor Sequence Call Step

Use the Semiconductor Sequence Call step to call a sequence and assign tests to Semiconductor Multi Test steps in the called sequence. Call a sequence in the current sequence file or in another sequence file. The Semiconductor Sequence Call step uses the Sequence Adapter.

Configuring the Step

Complete the following steps to create a subsequence with the Semiconductor Multi Test steps you want to call from a Semiconductor Sequence Call step.

1. Create a new sequence.
2. Insert one or more Semiconductor Multi Test steps in the sequence. The following figure shows a subsequence named MeasureGain. This subsequence consists of one Semiconductor Action step and two Semiconductor Multi Test steps.
   
   
   
   
3. On the Module tab of the Step Settings pane, specify the code modules you want to use for each step.
4. On the Tests tab, add tests and specify the published data ID for each test. Columns that appear greyed out are still editable after the Semiconductor Sequence Call calls the step.
   
   
   
   
5. Add and configure any other required steps, such as Semiconductor Action steps.
6. Save the sequence file.

Complete the following steps to configure a Semiconductor Sequence Call step.

1. Insert one or more Semiconductor Sequence Call steps into a sequence where you want to call the subsequence you created.
2. For each Semiconductor Sequence Call step, select the Module tab of the Step Settings pane and specify the sequence file that contains the subsequence.
3. Configure any additional Sequence Call Module options in the Module tab.
4. Select the Tests tab of the Step Settings pane. Configure the desired parameters for each Semiconductor Multi Test step called by the Semiconductor Sequence Call step.
   1. Define the Step Name.Published Data Id.

      Select the Step Name.Published Data Id of the Semiconductor Multi Test step for which you want to specify parameters. The dropdown selector displays all eligible combinations based on the published data ID values defined by the Semiconductor Multi Test steps within the selected sequence. The dropdown selector also autocompletes potential options as you type. The Semiconductor Sequence Call step assigns parameters to the Semiconductor Multi Test step that matches the selected step name and published data ID.

      The following figure shows the MainSequence sequence which consists of two Semiconductor Sequence Call steps:

      • Check 0.0V Gain
      • Check 1.0V Gain

      Each Semiconductor Sequence Call step consists of two tests. Each of these tests specify 1MHzResponse.Power and 5MHzResponse.Power in the Step Name.Published Data Id column. These values correspond to the following settings:

      • The step name of the test added in 2 of Configuring the Step.
      • The published data IDs specified in 4 of Configuring the Step.
      
      
      
      
      
   2. Define the following Tests settings:
      • Test Number
      • Test Name
      • Pin or Pin Group
      • High Limit and Low Limit
      • Scaling Factor
      • Base Units
      • Software Bin
      • Evaluation Type
      • Export Data To (the measurement destination)
5. Run the TestStand Sequence Analyzer and resolve any errors or warnings. TestStand Sequence Analyzer throws errors for any Semiconductor Sequence Call steps with unresolved Sequence Analyzer errors.
6. Run the sequence. Before TSM executes each Semiconductor Multi Test step, the Semiconductor Sequence Call step assigns the test parameters you specified to the Semiconductor Multi Test steps.

   The following figure shows the Semiconductor Multi Test steps called by Semiconductor Sequence Call steps—Check 0.0V Gain on the left and Check 1.0V Gain on the right. The corresponding Semiconductor Sequence Call step assigns the parameters for each Semiconductor Multi Test step.

   
   
   
   
   

Step Properties

The Semiconductor Sequence Call step defines a set of step properties, in addition to the built-in properties common to all TestStand steps.