Tutorial: Exploring a Basic Semiconductor Test Program with .NET

Open an existing sequence file and configure it to create a basic semiconductor test program with .NET.

Note
  • You must have NI-DCPower 15.1 or later installed, and you must have .NET 4.0 support for the NI-DCPower .NET Class Libraries 1.1 or later installed. If you do not have these components installed, refer to the Exploring a Basic Semiconductor Test Program with LabVIEW tutorial, which follows the same procedure but does not require these installations.
  • Completed solution files are located in the <TestStand Public>\Tutorial\NI_SemiconductorModule\Basic Test Program\DotNET\Solution directory.
  1. Open <TestStand Public>\Tutorial\NI_SemiconductorModule\Basic Test Program\DotNET\Basic Test Program.seq.
    This sequence file contains the following sequences:
    • MainSequence—Contains a single test step that performs a continuity test on all pins.
    • ProcessSetup—Simulates instrument initialization.
    • ProcessCleanup—Simulates instrument clean up.
  2. Complete the following steps to specify a pin map file to define the instrumentation on the tester, define the pins on the DUT, and define how the DUT pins are connected to the tester instrumentation for each test site.
    1. Select Semiconductor Module » Edit Test Program: Basic Test Program.seq or click the Edit Test Program: Basic Test Program.seq button on the TSM toolbar to launch the Test Program Editor for the sequence file.
    2. Select the Pin Map panel and enter Basic Test Program.pinmap in the Pin Map File Path control. The file name you enter is a relative path from the sequence file to the pin map file, Basic Test Program.pinmap, which is located in the same directory as the sequence file. Click the Open file for edit button located to the right of the Pin Map File Path display to open the Basic Test Program.pinmap file in the Pin Map Editor. Review the pin map and click OK to close the pin map editor.
    3. Click OK to close the Test Program Editor.
    4. After you specify a pin map file, select the MainSequence sequence in the sequence file. This sequence contains the Continuity Test step, which is an instance of the Semiconductor Multi Test step type and uses the .NET Adapter.
    5. Select the Continuity Test step and select the Tests tab of the Step Settings pane. You can use the Tests tab to define tests for individual pins or pin groups, and you can write code modules that refer to pin or pin group names without needing to know how each pin is connected to an instrument.
  3. Complete the following steps to specify a bin definitions file to define the hardware bins and software bins, define how the software bins relate to hardware bins, and define the default software bins in the test program.
    1. Select Semiconductor Module » Edit Test Program: Basic Test Program.seq.
    2. Select the Bin Definitions panel and enter Basic Test Program.bins in the Bin Definitions File Path control. The file name you enter is a relative path from the sequence file to the bin definitions file, Basic Test Program.bins, which is located in the same directory as the sequence file.
    3. Click the Open file for edit button located to the right of the Bin Definitions File Path display to open the Basic Test Program.bins file in the Bin Definitions Editor.
    4. Review the bin definitions and click OK to close the Bin Definitions Editor.
    5. Click OK to close the Test Program Editor.
    After you specify a bin definitions file, you can use the Tests tab of the Step Settings pane to define a software bin for each test.
  4. Complete the following steps to create a test program configuration and specify a test limits file to load limits values into Semiconductor Multi Test step tests at run time. When you use this technique, you can use the same test program with multiple configurations that each specify different limits for the tests.
    1. Select Semiconductor Module » Edit Test Program: Basic Test Program.seq.
    2. Select the Test Limits Files panel and click the Add Test Limits File button to add a new file reference to the test program.
    3. Enter Production Limits as the name to identify the new test limits file in the test program.
    4. Enter ProductionLimits.txt in the Test Limits File Path control. The file name you enter is a relative path from the sequence file to the test limits file, ProductionLimits.txt, which is located in the same directory as the sequence file.
    5. Select the Configurations panel and click the Add Configuration button to add a new configuration to the test program.
    6. Enter Production as the name of the configuration.
    7. Select the newly created Production panel. Each configuration you specify uses a corresponding Configuration panel that contains a table of the test conditions in the test program and fields for configuring the test limits file for the configuration.
    8. Select Production Limits in the Test Limits File control.
  5. Complete the following steps to add a test condition to the test program and specify a value for the test condition in the Production configuration.
    1. Select the Configuration Definition panel and click the Add Condition button to add a new test condition to the test program.
    2. Select TestFlowId from the Standard Condition option and click the Add button to add a new test condition for which each configuration can provide a unique value.
    3. Select the Production panel and enter Production for the value of the TestFlowId test condition in the table.
    4. Click OK to close the Test Program Editor.
  6. Complete the following steps to obtain the value of the TestFlowId test condition in the test program.
    1. Select the ProcessSetup sequence.
    2. Add a Get Test Information step after the Open Sessions step.
    3. On the Step Settings pane, click the Get Test Information tab.
    4. Enter TestFlowId for the Setting Name in the first row of the table.
    5. Set the Destination Expression to Locals.Flow.
    6. Highlight and right-click Locals.Flow and select Create "Locals.Flow" » String from the context menu to create a new local variable.
    7. Add a Message Popup step after the Get Test Information step in the Setup step group.
    8. On the Step Settings pane, click the Text and Buttons tab.
    9. Set the Message Expression to "Starting test flow: " + Locals.Flow.
  7. Complete the following steps to specify a code module for the Continuity Test step.
    1. Select the MainSequence sequence and the Continuity Test step.
    2. On the Step Settings pane, click the Module tab.
    3. Click the Browse for Assembly button located to the right of the Assembly control.
    4. Browse to <TestStand Public>\Tutorial\NI_SemiconductorModule\Basic Test Program\DotNET\Code Modules\BasicTestProgramTutorial.dll and click Open. Select the Use a relative path for the file you selected option when prompted and click OK.
    5. In the Root Class control, select the BasicTestProgramCodeModule class.
    6. In the .NET Invocation control, select the TestContinuity method.
    7. In the Parameter Table, configure the following parameter values:
      Parameter Value
      semiconductorModuleContext Step.SemiconductorModuleContext
      pinsAndPinGroups {"AllPins"}
  8. Save the sequence file.
  9. Complete the following steps to configure the Built-in Simulated Handler Driver.
    1. Select Semiconductor Module » Configure Station or click the Configure Station button on the TSM toolbar to launch the Configure Station Settings dialog box.
    2. On the General tab of the Configure Station Settings dialog box, place a check-mark in the Enable Handler/Prober Driver (Real or Simulated) check-box.
    3. Select Built-in Simulated Handler Driver from the Handler/Prober Driver drop-down menu.
    4. Click the Configure Handler/Prober Driver button to launch the Configure Built-in Simulated Handler dialog box.
    5. Set the Number of DUTs to Test option to 10 to specify how many DUTs the simulated lot contains and click OK to close the Configure Built-in Simulated Handler dialog box.
    6. Select the Advanced tab in the Configure Station Settings dialog box and click the Result Processing button to launch the Result Processing dialog box.
    7. Enable the Debug Test Results Log result processing plug-in.
    8. Disable the TestStand Report result processing plug-in.
    9. Enable the Display option for the Lot Summary Report result processing plug-in.
    10. Click OK to close the Result Processing dialog box, and click OK to close the Configure Station Settings dialog box.
  10. Complete the following steps to configure a lot to run.
    1. Select Semiconductor Module » Configure Lot or click the Configure Lot button on the TSM toolbar to launch the Configure Lot Settings dialog box.
    2. Select Production in the Test Program Configuration option.
    3. Click OK to close the Configure Lot Settings dialog box.
      Note You can also use the Active Configuration drop-down menu on the TSM toolbar to set the configuration. TSM uses previously set values for the other lot settings that appear in the Configure Lot Settings dialog box.
  11. Click the Show Lot Statistics Viewer button on the TSM toolbar to launch a floating window that shows the binning results of the test program execution. The execution control buttons, such as Start/Resume Lot and End Lot and the Configuration drop-down menu are also available in the Lot Statistics Viewer for convenience.
  12. Click the Start Lot button on the TSM toolbar or in the Lot Statistics Viewer to execute the test program. The test program launches a dialog box that shows the value of the TestFlowId test condition. Click OK to close the dialog box. TestStand generates and displays the Lot Summary Report on the Report pane of the Execution window. Review the results of the lot.
  13. Click the Active Report button to switch to the Debug Test Results Log and review the results of each test.
    Note The Production configuration overrides the test limits the sequence specifies. The ProductionLimits.txt test limits file provides the test limits values to use for each test instead of the values entered in the Semiconductor Multi Test step.
  14. Close the Execution and Sequence File windows.