Semiconductor Sequence Call Step Properties

The Semiconductor Sequence Call step defines the following properties. These properties are assigned to the Semiconductor Multi Test step tests in the called sequence that have corresponding step names and published data IDs.

TSM replaces all step property values for the Semiconductor Multi Test steps in the called sequence, except MeasurementSourceExpr and MeasurementDestinationExpr, with the values specified in the Semiconductor Sequence Call step.

• Result.Evaluations—An array that stores the tests you configure for the step on the Tests edit tab. The NI_SemiconductorModule_Evaluation data type defines the following fields:
  • EvaluationType—The type of evaluation the test performs. The default evaluation type is Numeric Limit.
  • Pin—A string that stores the test pin or pin group.
  • MeasurementId—A string that stores the Step Name.Published Data Id value. The Semiconductor Sequence Call step uses the step name and published data ID to assign the tests you specify to the Semiconductor Multi Test steps in the called sequence.
  • TestNumberExpr—An expression that determines the test number at run time. If you specify this expression, the Semiconductor Multi Test step you call from the Semiconductor Sequence Call step evaluates the expression and copies the evaluated value to its TestNumber property.
  • TestNumber—A number that stores the test number.
  • FailBinExpr—An expression that determines the software fail bin for the test at run time. The expression must evaluate to a valid software bin number. If you specify this expression, the Semiconductor Multi Test step you call from the Semiconductor Sequence Call step evaluates the expression and copies the evaluated value to the FailBin property.
  • FailBin—A number that stores the software fail bin for the test.
  • TestNameExpr—An expression that determines the test name at run time. If you specify this expression, the Semiconductor Multi Test step you call from the Semiconductor Sequence Call step evaluates the expression and copies the evaluated value to its TestName property.
  • TestName—A string that stores the test name.
  • MeasurementSourceExpr—The value of this property is not used by the Semiconductor Sequence Call step and it is not passed to Semiconductor Multi Test steps. The value cannot be set on the Tests edit tab of the Semiconductor Sequence Call step.
  • MeasurementDestinationExpr—Optional. An expression that specifies a custom location in the context of the Semiconductor Sequence Call step to store the numeric or Boolean measurement value. The Semiconductor Multi Test step stores the measurement value in the locations specified by the MeasurementDestinationExpr properties of the Semiconductor Multi Test step and the Semiconductor Sequence Call step after the step performs the test.
  • Status—This property is not used by the Semiconductor Sequence Call step.
  • NumericLimit—The NI_SemiconductorModule_Evaluation_NumericLimit data type defines the following fields:
    • Data—This property is not used by the Semiconductor Sequence Call step.
    • LowLimitExpr, LowLimit, HighLimitExpr, and HighLimit—The limits for the test.
    • ComparisonType— The type of comparison, such as "GELE".
    • Units—A string that stores the base units for the limits and measurement value.
    • DataScalingExponent, LowLimitScalingExponent, HighLimitScalingExponent—Numbers that determine the scaling factors for the measurement value and each limit value. Each of these properties contains an integer value that TSM uses as an exponent for the number 10 to determine the scaling factor.
    • CorrelationOffset—The correlation offset value to apply to test results on a per-site basis at run time before evaluating the test result data against limits. The Load Correlation Offsets step sets this property.
    • SimulatedData—The SimulatedData container uses the following fields to specify values for tests in Offline Mode:
      • SimulatedDataUsageType—Set to AllSites to specify a single value for all sites. Set to PerSite to specify specific values for each site. Set to UsePublishedValue if you want to use the published values. The default value is None, which specifies the default behavior of Offline Mode to ignore the values of AllSite, PerSite, and the published values.
      • AllSites—Specifies a single value for all sites.
      • PerSite—Specifies specific values for each site.
  • PassFail—The NI_SemiconductorModule_Evaluation_PassFail data type defines the following fields:
    • Data—This property is not used by the Semiconductor Sequence Call step.
    • SimulatedData—The SimulatedData container uses the following fields to specify values for tests in Offline Mode:
      • SimulatedDataUsageType—Set to AllSites to specify a single value for all sites. Set to PerSite to specify specific values for each site. Set to UsePublishedValue if you want to use the published values. The default value is None, which specifies the default behavior of Offline Mode to ignore the values of AllSite, PerSite, and the published values.
      • AllSites—Specifies a single value for all sites.
      • PerSite—Specifies specific values for each site.
• DotNetRuntimeData—A hidden object reference that sub-steps of the Semiconductor Sequence Call step use to cache run-time information about the step. Do not directly interact with this property.