Logging Failed Cycle Information from NI-Digital Pattern Driver to STDF Log File (TSM)
- Updated2025-06-26
- 1 minute(s) read
You can fetch and publish failed cycle information from the NI-Digital Pattern Driver and log the information in the STDF Log file.
Note TSM does not support logging failed cycles when using multiple NI-Digital Pattern Driver sessions to burst a pattern for a site. If you need multiple instruments to burst a pattern for a site, combine those instruments into a group in the pin map so the test program uses a single session to burst the pattern.
Related Information
- Fetching and Publishing Failed Cycle Information in LabVIEW Code Modules (TSM)
Fetch and publish failed cycle information from an NI-Digital Pattern Driver with your LabVIEW application.
- Failed Cycle Information in Functional Test Records (FTRs) (TSM)