Fetching and Publishing Failed Cycle Information in LabVIEW Code Modules (TSM)

Fetch and publish failed cycle information from an NI-Digital Pattern Driver with your LabVIEW application.

  1. To configure the NI-Digital Pattern Driver to acquire failed cycle information, place an niDigital property node on the block diagram and set the following properties:
    1. Triggers » History RAM » Type—Set to First Failure to start acquiring information on the first failed cycle.
    2. History RAM » Cycles to Acquire—Set to Failed Cycles to acquire only failed cycles.
    3. History RAM » Max Samples to Acquire per Site—Set to the maximum number of failed cycles you want to acquire per site.
  2. After configuring the NI-Digital Pattern instrument and bursting a pattern, use the niDigital Fetch Multi-Site History RAM Information VI to fetch the failed cycle information and organize the information into a format the TSM Code Module API can consume.
    Note The niDigital Fetch Multi-Site History RAM Information VI does not appear on the NI-Digital Pattern Driver palette. Browse to and select the VI from the NI-Digital Pattern Driver library file (niDigital.llb), located in the <LabVIEW>\instr.lib\niDigital directory.
  3. Wire the output of the niDigital Fetch Multi-Site History RAM Information VI to the History RAM Information input of the Publish Pattern Results VI in the TSM Code Module API. TSM logs the failed cycle information in Functional Test Records (FTRs) in the STDF Log file.
The following figure shows how to fetch and publish failed cycle information in a code module. This example logs a maximum of 10 failed cycles.