Battery Cell Quality Toolkit Examples

NI installs example code with your software or driver that demonstrates the functionality of Battery Cell Quality Toolkit. Use these examples to learn about the product or accelerate your own application development.

Most NI products install examples that you can access directly or from within NI software. The example experience can differ slightly across products and versions.

Battery Cell Quality Toolkit examples are located in the C:\Program Files\NI\LVAddons\nibcq\1\examples directory.

AC Internal Resistance Examples

Table 7. Common AC Internal Resistance (ACIR) Examples
Example Name Description
ACIR Create or Override Compensation Files.vi This example demonstrates how to capture compensation values for a single frequency (ACIR). The compensation files created by this VI are located in the following directory: C:\Users\Public\Documents\National Instruments\NI-Cell Quality. Each compensation file name contains the type of compensation and the SMUs serial number that identifies the SMU that is used in the run.
ACIR Create or Override Compensation Files with Temperature.vi This example demonstrates how to capture compensation values and temperature values for a single frequency (ACIR). The compensation files created by this VI are located in the following directory: C:\Users\Public\Documents\National Instruments\NI-Cell Quality. Each compensation file name contains the type of compensation and the SMUs serial number that identifies the SMU that is used in the run.
ACIR Test.vi This example demonstrates how to perform ACIR tests.
ACIR Test with Switching.vi This example demonstrates how to perform ACIR tests using multiplexer switching.
ACIR Test with Temperature.vi This example demonstrates how to monitor the temperature during ACIR tests.

Electrochemical Impedance Spectroscopy Examples

Table 8. Common Electrochemical Impedance Spectroscopy (EIS) Examples
Example Name Description
EIS Create or Override Compensation Files.vi This example demonstrates how to capture compensation values for multiple frequencies (EIS). The compensation files created by this VI are located in the following directory: C:\Users\Public\Documents\National Instruments\NI-Cell Quality. Each compensation file name contains the type of compensation and the SMUs serial number identifying the SMU used in the run.
EIS Create or Override Compensation Files with Temperature.vi This example demonstrates how to capture compensation values and temperature values for multiple frequencies (EIS). The compensation files created by this VI are located in the following directory: C:\Users\Public\Documents\National Instruments\NI-Cell Quality. Each compensation file name contains the type of compensation and the SMUs serial number identifying the SMU used in the run.
EIS Test with Plot.vi This example demonstrates how to perform EIS tests.
EIS Test Multi Session with Plot.vi This example demonstrates how to perform multiple simultaneous and parallel EIS tests using multiple SMUs.
EIS Test with Plot and Switching.vi This example demonstrates how to perform EIS tests using multiplexer switching.
EIS Test with Plot and Temperature.vi This example demonstrates how to monitor the temperature during EIS tests.

DC Internal Resistance Examples

Table 9. Common DC Internal Resistance (DCIR) Examples
Example Name Description
DCIR Test.vi This example demonstrates how to perform DCIR tests.
DCIR Parallel Eloads Test.vi This example demonstrates how to perform DCIR tests using multiple electronic loads in parallel.

Open Circuit Voltage Examples

Table 10. Common Open Circuit Voltage (OCV) Examples
Example Name Description
OCV Test.vi This example demonstrates how to measure an open circuit voltage and use available parameters to obtain the desired measurement quality and test time.
OCV Concurrent Sessions.vi This example demonstrates how to perform multiple tests with difference devices simultaneously.