RF Integrated Circuit (RFIC) Test

With more wireless technologies and demands for shorter time-to-market, engineers need a faster and more flexible approach that reduces development and test costs for testing RFICs.

NI Expertise Overview

The demands of emerging wireless standards such as LTE Advanced Pro, 5G, and 802.11ax are creating new test challenges for today's engineers. These standards—in addition to emerging technologies such as envelope tracking (ET) and digital predistortion (DPD)—make it even more difficult to reduce test times and increase throughput without sacrificing accuracy or increasing cost. NI PXI-based test solutions combine RF measurements with mixed-signal instrumentation to provide a complete solution for high volume production test of RF power amplifiers (PAs), RF front end (RFFE) modules, transceivers, and integrated modules. NI PXI solutions can serve test needs from characterization through final manufacturing test, reducing the cost of test and time to market.

Featured Content

Products and Solutions

Application Resource Kit

Fundamentals of Power Amplifier Testing

The power amplifier – as either a discrete component or part of an integrated front end module (FEM) – is one of the most integral RFICs in the modern radio. In this two-part series, you will learn the basics of testing RF PAs and FEMs through interactive white papers with multiple how-to videos.