Rapid technological changes pressure engineers to cut semiconductor testing costs while maintaining quality for RF and mixed-signal ICs. AI-focused devices drive high-end ATE use, while legacy platforms grow obsolete. Traditional ATE systems are rigid and costly, leaving analog and mixed-signal manufacturers seeking flexible test solutions that balance cost, speed, and coverage.
Device complexity is growing, but test costs don’t have to. NI modular, software-defined test systems scale from characterization to high-volume semiconductor testing, helping you cut cost per device while accelerating yield ramps. Whether you need a production-ready ATE turnkey solution, a highly optimized custom PXI tester, or intelligent enterprise software for analytics-driven yield optimization, NI technologies help you align test coverage, throughput, and cost at every stage of the lifecycle.
FEATURED SOLUTION
The NI Semiconductor Test System (STS) combines PXI instruments, test program software, and in-situ calibration in an industrial test head form factor to deliver seamless test cell integration. Proven across RF devices and mixed-signal ICs, it delivers superior throughput and cost efficiency without sacrificing quality.
The NI STS is an intelligent, cost-optimized semiconductor production test solution that delivers workflow-ready ATE for RF devices and mixed-signal ICs. For custom requirements, modular PXI instruments, pre-assembled 19" test racks, and software for test automation and analytics deliver flexibility, scalability, and accelerated path to production. Both options leverage a modular, software-connected approach, streamlining debug, development, and automation to shorten time to market.
ON Semiconductor chose NI STS for a scalable and cost-effective ATE solution across wafer sort and final test when traditional ATE solutions couldn’t meet their needs.
FitTech used NI PXI Source Measure Units to reduce footprint, accelerate test time, and increase parallelism for MiniLED production test without sacrificing quality.
We’re using STS for both wafer probe and final packaged test for many of our product portfolios… To date, we have tested several hundred million units. We are continually impressed by the reliability and availability of these systems.
General Manager
Analog Devices
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