Accessing Lot Settings from a Test Program (TSM)
- Updated2025-07-31
- 3 minute(s) read
Use the Get Test Information step to access standard and custom lot settings in a test program sequence file.
The following table lists the properties of the NI_SemiconductorModule_StandardLotSettings data type, the fields of the Master Information Record (MIR) of the Standard Test Data Format (STDF) version 4 specification that the STDF Log result processing plug-in sets using the properties, or other purpose of each property.
| Property Name | Corresponding STDF Record Field or Other Purpose |
|---|---|
| ActiveConfigurationName | Specifies the name of the test program configuration to use to obtain standard lot settings and custom test conditions. |
| AuxiliaryDataFile | MIR: AUX_FILE |
| BurnInTime | MIR: BURN_TIM |
| CommandModeCode | MIR: CMOD_COD |
| CorrelationOffsetsFileAbsolutePath | Contains the absolute path of the correlation offsets file the Load Correlation Offsets step loads. Do not set this property. TSM sets this property at run time. If the test program does not use correlation offsets, this property is an empty string. If the test program executes multiple Load Correlation Offsets steps, this property contains the path loaded by the step that executed last. |
| DateCode | MIR: DATE_COD |
| DeviceDesignRevision | MIR: DSGN_REV |
| EngineeringLotId | MIR: ENG_ID |
| FabricationProcessId | MIR: PROC_ID |
| JobName | MIR: JOB_NAM (Default value is the test program sequence filename without the file extension.) |
| JobRevision | MIR: JOB_REV (Default value is the test program sequence file version.) |
| LimitsFileAbsolutePath | Contains the absolute path of the test limits file that TSM used to import test limits at run time. Do not set this property. TSM sets this property at run time. |
| LimitsFileRelativePath | Specifies the test limits file to use for importing test limits at run time. Use the Test Program Editor to specify the limits file for a test program configuration. TSM sets this property at run time to the limits file the active test program configuration specifies. |
| LimitsFileReplaceTests | Specifies whether TSM deletes existing tests before importing limits from a test limits file that LimitsFileRelativePath specifies. A value of True corresponds to the Replace all tests in matching steps import mode. A value of False corresponds to the Update limits in matching tests import mode. |
| LotId | MIR: LOT_ID |
| LotSize | Corresponds to the Estimated Lot Size option in the Configure Lot Settings dialog box. An inline QA algorithm can use this property to determine for which DUTs to enable inline QA. |
| MainSequenceFilePath | Specifies the file path of the test program main sequence file to use with the current test lot. |
| MIRUserText | MIR: USER_TXT |
| OperationFrequency | MIR: OPER_FRQ |
| OperatorName | MIR: OPER_NAM |
| PackageType | MIR: PKG_TYP |
| PartType | MIR: PART_TYP |
| ProductFamilyId | MIR: FAMLY_ID |
| ProtectionCode | MIR: PROT_COD |
| RequireEveryStepToBeInLimitsFile | Specifies whether TSM requires that every step or test in the test program sequence file have a corresponding entry in the test limits file when importing limits from a test limits file. |
| RetestCode RetestCount* |
MIR: RTST_COD |
| ROMCodeId | MIR: ROM_COD |
| SetupTime | MIR: SETUP_T This value represents the setup time in seconds since midnight (00:00:00), January 1, 1970, coordinated universal time (UTC). UTC is also known as Greenwich mean time. The STDF Log result processing plug-in converts this value to local time when storing the value in the SETUP_T field. |
| SublotId |
MIR: SBLOT_ID TSM sets the SBLOT_ID field to the wafer ID obtained from the prober driver when you enable the Generate One File per Wafer STDF option and the SublotId lot setting property value is empty. |
| SupervisorName | MIR: SUPR_NAM |
| TestCode | MIR: TEST_COD |
| TestFlowId | MIR: FLOW_ID |
| TestModeCode | MIR: MODE_COD |
| TestSetupId | MIR: SETUP_ID |
| TestSpecificationName | MIR: SPEC_NAM |
| TestSpecificationVersion | MIR: SPEC_VER |
| TestTemperature | MIR: TST_TEMP |
| UseEmbeddedLimitsFileData | Indicates whether the limits file data is embedded in the test program sequence file. Do not set this property. TSM sets this property at run time based on the active configuration. |
| Wafer.WaferSize | WCR: WAFR_SZ |
| Wafer.DieHeight | WCR: DIE_HT |
| Wafer.DieWidth | WCR: DIE_WID |
| Wafer.Units | WCR: WF_UNITS |
| Wafer.FlatOrientation | WCR: WF_FLAT |
| Wafer.CenterXCoordinate | WCR: CENTER_X |
| Wafer.CenterYCoordinate | WCR: CENTER_Y |
| Wafer.PositiveXDirection | WCR: POS_X |
| Wafer.PositiveYDirection | WCR: POS_Y |
* If (RetestCode is not empty string) then RTST_COD = RetestCode Else If (RetestCount is in the range [0-9]) then RTST_COD = '0' - '9' Else RTST_COD = space |
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