Use the Get Test Information step to access standard and custom lot settings in a test program sequence file.

The following table lists the properties of the NI_SemiconductorModule_StandardLotSettings data type, the fields of the Master Information Record (MIR) of the Standard Test Data Format (STDF) version 4 specification that the STDF Log result processing plug-in sets using the properties, or other purpose of each property.

Note Use the Types window in the TestStand Sequence Editor to review properties on the standard type or to add properties to the custom type.
Property Name Corresponding STDF Record Field or Other Purpose
ActiveConfigurationName Specifies the name of the test program configuration to use to obtain standard lot settings and custom test conditions.
AuxiliaryDataFile MIR: AUX_FILE
BurnInTime MIR: BURN_TIM
CommandModeCode MIR: CMOD_COD
CorrelationOffsetsFileAbsolutePath Contains the absolute path of the correlation offsets file the Load Correlation Offsets step loads. Do not set this property. TSM sets this property at run time. If the test program does not use correlation offsets, this property is an empty string. If the test program executes multiple Load Correlation Offsets steps, this property contains the path loaded by the step that executed last.
DateCode MIR: DATE_COD
DeviceDesignRevision MIR: DSGN_REV
EngineeringLotId MIR: ENG_ID
FabricationProcessId MIR: PROC_ID
JobName MIR: JOB_NAM (Default value is the test program sequence filename without the file extension.)
JobRevision MIR: JOB_REV (Default value is the test program sequence file version.)
LimitsFileAbsolutePath Contains the absolute path of the test limits file that TSM used to import test limits at run time. Do not set this property. TSM sets this property at run time.
LimitsFileRelativePath Specifies the test limits file to use for importing test limits at run time. Use the Test Program Editor to specify the limits file for a test program configuration. TSM sets this property at run time to the limits file the active test program configuration specifies.
LimitsFileReplaceTests Specifies whether TSM deletes existing tests before importing limits from a test limits file that LimitsFileRelativePath specifies. A value of True corresponds to the Replace all tests in matching steps import mode. A value of False corresponds to the Update limits in matching tests import mode.
LotId MIR: LOT_ID
LotSize Corresponds to the Estimated Lot Size option in the Configure Lot Settings dialog box. An inline QA algorithm can use this property to determine for which DUTs to enable inline QA.
MainSequenceFilePath Specifies the file path of the test program main sequence file to use with the current test lot.
MIRUserText MIR: USER_TXT
OperationFrequency MIR: OPER_FRQ
OperatorName MIR: OPER_NAM
PackageType MIR: PKG_TYP
PartType MIR: PART_TYP
ProductFamilyId MIR: FAMLY_ID
ProtectionCode MIR: PROT_COD
RequireEveryStepToBeInLimitsFile Specifies whether TSM requires that every step or test in the test program sequence file have a corresponding entry in the test limits file when importing limits from a test limits file.
RetestCode

RetestCount*

MIR: RTST_COD
ROMCodeId MIR: ROM_COD
SetupTime MIR: SETUP_T This value represents the setup time in seconds since midnight (00:00:00), January 1, 1970, coordinated universal time (UTC). UTC is also known as Greenwich mean time. The STDF Log result processing plug-in converts this value to local time when storing the value in the SETUP_T field.
SublotId

MIR: SBLOT_ID

TSM sets the SBLOT_ID field to the wafer ID obtained from the prober driver when you enable the Generate One File per Wafer STDF option and the SublotId lot setting property value is empty.

SupervisorName MIR: SUPR_NAM
TestCode MIR: TEST_COD
TestFlowId MIR: FLOW_ID
TestModeCode MIR: MODE_COD
TestSetupId MIR: SETUP_ID
TestSpecificationName MIR: SPEC_NAM
TestSpecificationVersion MIR: SPEC_VER
TestTemperature MIR: TST_TEMP
UseEmbeddedLimitsFileData Indicates whether the limits file data is embedded in the test program sequence file. Do not set this property. TSM sets this property at run time based on the active configuration.
Wafer.WaferSize WCR: WAFR_SZ
Wafer.DieHeight WCR: DIE_HT
Wafer.DieWidth WCR: DIE_WID
Wafer.Units WCR: WF_UNITS
Wafer.FlatOrientation WCR: WF_FLAT
Wafer.CenterXCoordinate WCR: CENTER_X
Wafer.CenterYCoordinate WCR: CENTER_Y
Wafer.PositiveXDirection WCR: POS_X
Wafer.PositiveYDirection WCR: POS_Y
* If (RetestCode is not empty string) then 
   RTST_COD = RetestCode
Else If (RetestCount is in the range [0-9]) then
   RTST_COD = '0' - '9' 
Else 
   RTST_COD = space