Use the Runtime Data Viewer to view test results and triggered alarms in order to debug issues at runtime.
  1. To start logging, open the Runtime Data Viewer from Semiconductor Module » Show Runtime Data Viewer.
  2. Start testing by clicking Start Lot or Single Test on the TSM toolbar.
  3. Click between the following tabs to view your data in different formats.
    • Summary—Each row represents a test and each column represents a part. TSM adds new parts on the left as the tests proceed.

      TSM shows the test result value for numeric tests and a blank cell for pass/fail tests. For each result, a green-colored cell indicates a passed test, a red-colored cell indicates a failed test, and red borders indicate a triggered alarm.

    • Detailed—TSM shows each test on each part in the order of execution.
  4. Optional: Filter the data you view.
    • Click Select columns and rows to view to filter the columns and rows to view.
    • Click to filter the rows to view.
  5. Optional: Click Copy filtered list to clipboard to copy the filtered data.
  6. Optional: Click Clear all test results to clear all results.
    TSM automatically clears all results when you start a new lot.
  7. To stop logging, close the Runtime Data Viewer.