Use the Runtime Data Viewer to view test results and triggered alarms in order to debug issues at runtime.
  1. To start logging, open the Runtime Data Viewer from Semiconductor Module » Show Runtime Data Viewer.
  2. Start testing by clicking Start Lot or Single Test on the TSM toolbar.
    Note You can specify the number of batches to store in memory in the Max History setting. To access this setting, click the gear icon (Settings) in the top right of the Runtime Data Viewer window. Controlling the number of batches frees memory resources. This setting does not affect data logged by report plugins.
  3. Click between the following tabs to view your data in different formats.
    • Summary—Each row represents a test and each column represents a part. Runtime Data Viewer adds new parts on the left as the tests proceed.

      Runtime Data Viewer shows the test result value for numeric tests and a blank cell for pass/fail tests. For each result, a green-colored cell indicates a passed test, a red-colored cell indicates a failed test, and red borders indicate a triggered alarm.

    • Detailed—Runtime Data Viewer shows each test on each part in the order of execution.
  4. Optional: Filter the data you view.
    • Click Display Settings on the Summary tab to apply and configure filters. You can also specify the maximum number of columns (parts) to show. Fewer visible results improve Runtime Data Viewer performance.
    • Click Display Settings on the Detailed tab to show or hide columns. You can also limit the number of results to the last specified number of batches. Fewer visible results improve Runtime Data Viewer performance.
    • Click on each column on the Detailed tab to set filters for the selected column.
  5. Optional: Click Copy filtered list to clipboard to copy the filtered data.
  6. Optional: Click Clear all test results to clear all results.
    Runtime Data Viewer automatically clears all results when you start a new lot.
  7. To stop logging, close the Runtime Data Viewer.