This example demonstrates how to enable and perform part average testing (PAT) in a test program.

Example File Locations <TestStand Public> \Examples\NI_SemiconductorModule\Part Average Testing\LabVIEW\Part Average Testing Example.seq
Highlighted Features
  • TSM PAT plug-in architecture
  • Test Program Editor PAT Algorithm Settings panel
  • Semiconductor Multi Test Part Average Testing tab
  • Perform Part Average Testing step
  • Static PAT limits file
  • OnSiteTestingComplete callback sequence
Major API TSM Application API
Prerequisites
Note To perform part average testing, you must place the PAT plug-in files in the <TestStand Public>\Components\Callbacks\NI_SemiconductorModule directory. Opening the Part Average Testing Example.seq file in the TestStand Sequence Editor automatically copies the example PAT plug-in files from the <TestStand Public>\Examples\NI_SemiconductorModule\Part Average Testing\Example Part Average Testing Plug-In directory to the <TestStand Public>\Components\Callbacks\NI_SemiconductorModule directory. Closing the Part Average Testing Example.seq file removes the example PAT plug-in files from the <TestStand Public>\Components\Callbacks\NI_SemiconductorModule directory.
  • You must have the LabVIEW Development System installed, and you must configure the LabVIEW Adapter to use the LabVIEW Development System.
  • You must have NI-DCPower 15.1 or later installed. You do not need an NI-DCPower instrument because this example uses simulated instrument sessions.
  • This example uses the Batch process model.
Note You can view the test program in the TestStand Sequence Editor and partial code modules in LabVIEW without the required NI instrument drivers installed. Install the drivers to view the full code modules in LabVIEW. Visit ni.com/info and enter the Info Code rddrau to access the latest software drivers and updates.

Complete the steps in the following sections to learn about TSM PAT plug-ins, to access and modify the PAT settings, and to enable, disable, and configure part average testing for individual tests.

  1. Select Semiconductor Module » Edit Test Program: Part Average Testing Example.seq or click the Edit Test Program: Part Average Testing Example.seq button on the TSM toolbar to launch the Test Program Editor for the sequence file.
  2. Select the PAT Algorithm Settings panel and review the following settings the test program specifies for the PAT plug-in to use.
    • Disable Static Part Average Testing—Disables all static part average testing for the test program.
    • Disable Dynamic Part Average Testing—Disables all dynamic part average testing for the test program.
    • Static PAT Limits File—Specifies a relative path to a file that contains static limits for all tests enabled for static part average testing in the test program. The example PAT algorithm uses the IPartAverageTestingStaticLimitLoader.LoadStaticLimits method in the TSM Application API to load a static limits file that uses the same structure as a TSM test limits file. To read and use limits from a different file format, you must implement a custom file reader and a custom data structure to store the limits.
    • Statistics Type—Specifies the type of statistics to use to calculate dynamic PAT limits.
    • Window Size—Specifies how many measurements of previously tested DUTs to use to calculate the dynamic limits for the DUT currently being tested.
    • Early Part Count—Specifies how many parts in a lot must complete testing before considering the computed dynamic limits statistically valid. DUTs that complete testing before this value are called early parts. This example PAT algorithm sets the dynamic limits for early parts to the test program limits.
  3. Select the Continuity step in the MainSequence sequence. The example will perform part average testing for the tests in this step when it executes the Perform Part Average Testing step.
  4. Click the Part Average Testing tab.
  5. Add a checkmark to or remove a checkmark from the checkboxes in the Enable Dynamic PAT and Enable Static PAT columns.
  6. Set test numbers, test names, and software fail bins for the tests with dynamic or static part average testing enabled. Bins must be defined in the bin definitions file.
  7. Enable and display the Debug Test Results Log by placing a checkmark in the Enabled column and in the Display column of the Result Processing dialog box.
  8. Ensure that you meet the prerequisites, then click the Single Test button on the TSM toolbar to test a single part on each site.
  9. Click the End Lot button.
  10. Click the Report pane of the Execution window and review the Debug Test Results Log to see the PAT tests that executed during the MainSequence sequence.