Logging Custom Data to the STDF Log File (TSM)
- Updated2025-07-31
- 2 minute(s) read
The STDF Log result processing plug-in automatically logs data to the STDF log file about the tester configuration and test execution. You can customize tester, part, wafer, and text data to log in the STDF log file.
| Type of Data | Description | ||||||
|---|---|---|---|---|---|---|---|
| Tester | The Master Information Record (MIR), Site
Description Record (SDR), and Wafer Configuration Record (WCR) in the STDF log file
store information about the configuration of the tester itself. TSM automatically
logs data from the NI_SemiconductorModule_StandardLotSettings and NI_SemiconductorModule_StandardStationSettings data types to these
records. You can customize the data stored in the STDF log records by using
callbacks to modify the data in the containers within TestStand. TSM stores the
following values in the MIR in addition to values TSM obtains from the
NI_SemiconductorModule_LotSettings and NI_SemiconductorModule_StationSettings data
types:
|
||||||
| Part | The Part Results Record (PRR) in the STDF log file stores information about each tested part, including the Part ID, X and Y coordinates of the location of the part on the die, and a text description for the part. You can customize the data TSM logs from the UUT container to these fields within the PRR record. | ||||||
| Wafer | The Wafer Information Record (WIR) and Wafer Result Record (WRR) in the STDF log file store information related to wafer tests. If you are performing wafer testing, you can customize the data stored in these records by modifying the value of the WaferRuntimeData parameter in the StartOfTest handler/prober driver entry point. | ||||||
| Text | If the data you want to add to the STDF log
file is not included in any of the above records,
you can include text data as a Datalog Text Record
(DTR) in the STDF log file by using the following
techniques:
|
Related Information
- Standard Test Data Format (STDF) Log (TSM)
- NI_SemiconductorModule_LotSettings Data Type
- NI_SemiconductorModule_StationSettings Data Type
- Customizing STDF MIR, SDR, and WCR Field Values (TSM)
- Customizing STDF PRR Field Values (TSM)
- Customizing STDF WIR and WRR Field Values (TSM)
- StartOfTest Handler/Prober Driver Entry Point (TSM)
- Adding DTRs to the STDF Log File (TSM)