Customizing STDF WIR and WRR Field Values (TSM)
- Updated2025-07-31
- 1 minute(s) read
Customizing STDF WIR and WRR Field Values (TSM)
The STDF Log result processing plug-in sets the fields in the Wafer Information Record (WIR) and Wafer Result Record (WRR) of the STDF log file by using the values returned in the WaferRuntimeData parameter of the StartOfTest handler/prober driver entry point as shown in the following table.
| STDF WIR or WRR Field | Handler/Prober StartOfTest Output Parameter |
|---|---|
| WAFER_ID | WaferRuntimeData.Identity.WaferId Note TSM
automatically generates unique wafer IDs by setting the
WaferRuntimeData.Identity.WaferId parameter value before calling
the StartOfTest entry point. A prober driver can override the
wafer IDs by modifying the parameter value. |
| FABWF_ID | WaferRuntimeData.Identity.FabWaferId |
| FRAME_ID | WaferRuntimeData.Identity.FrameId |
| MASK_ID | WaferRuntimeData.Identity.MaskId |
| USR_DESC | WaferRuntimeData.Identity.UserDescription |
| EXC_DESC | WaferRuntimeData.Identity.ExecDescription |