What is the Electronically Scanned Array (ESA) Characterization Reference Architecture?

The ESA Characterization Reference Architecture is a modular, scalable solution that includes a pulsed RF measurements library to meet complex test challenges across the design lifecycle.

Pulse Analysis on ESA

Perform Pulse Analysis on ESA

The reference architecture’s modular hardware library and IP library for ESA demonstrates how to perform pulse analysis, such as pulse profile and pulse stability, to properly characterize power amplifiers and transmit/receive modules.

S-Parameters on ESA Using VST

Measure S-Parameters

The ESA Characterization Reference Architecture helps you perform flexible S-parameter measurements using CW and pulsed waveforms on the same hardware as large signal analysis with a VST. You can combine S-parameters with other tests and simplify integration using a single reconfigurable, modular system.

Power-Added Efficiency on ESA

Measure PAE on ESA Components

The reference architecture IP simplifies integration of DC and RF measurements in both interactive examples and programmatic APIs for power added efficiency (PAE) measurements.

Automate ESA measurements with TestStand

Automate ESA Measurements

The ESA Characterization Reference Architecture show you how to automate common measurements such as power-added efficiency using TestStand so that you can perform measurements over power and frequency.

Featured Content

 

Design and Test Challenges of the Modern Electronically Scanned Array

 

Learn more about the challenges of testing Electronically Scanned Array (ESA) components.

 

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