To control the test system programmatically, call methods directly on the Semiconductor Module Manager object, such as StartLot, PauseLot, and EndLot.

Controlling Test Systems Using Buttons on Operator Interfaces

Complete the following tasks to use the Command objects to control the test system using buttons on an operator interface.

  • Get a specific Command object that corresponds to the action for the button on the operator interface, such as StartLot or EndLot, by calling the GetCommand method on the Semiconductor Module Manager object.
  • Use the properties on the Command object to determine the text to display and the enabled state of the button.
  • Use the events on the Command object to determine when to update the text or enabled state of the button.
  • Use the Execute method on the Command object to initiate the action.

Monitoring the State of the Test System

Complete the following tasks to use an Observer object to monitor the state of the test system.

  • Create an Observer object by calling the CreateObserver method on the Semiconductor Module Manager object.
  • Use the events on the Observer object to determine when changes to test system state occur.
  • Use the TestingState property on the Semiconductor Module Manager object to determine the current state of the test system.
  • Use the TesterStatus property on the Semiconductor Module Manager object to get a description of the current state of the test system.

Obtaining Test Statistics

Complete the following tasks to use the Lot Statistics object to obtain test statistics for individual test sites or for all test sites. The statistics are available for the entire lot or for the current wafer in the lot.

  • Get the Lot Statistics object for an individual test site by calling the GetSiteLotStatistics or GetWaferSiteLotStatistics methods on the Semiconductor Module Manager object.
  • Get the Lot Statistics object for all test sites by accessing the AllSiteLotStatistics or WaferAllSiteLotStatistics properties on the Semiconductor Module Manager object.
  • Use the properties and methods on the Lot Statistics object to get the following types of information:
    • Number of passing and failing parts
    • Number of parts in each software bin and hardware bin
    • Average socket time
    • Average cycle time

Obtaining Information about the Test Execution

Complete the following tasks to use the Site Runtime Data, Batch Runtime Data, or Wafer Runtime Data objects to obtain run-time data for individual test sites for the current batch of parts on each test site or for the current wafer.

Note Some of the run-time data properties have valid values only at particular points during execution. Refer to the documentation of the property to determine when to access a property.
  • In LabVIEW, use the Get Site Runtime Data VI to obtain the run-time data for an individual site. In .NET, call the GetSiteRuntimeData method on the Semiconductor Module Manager object and index into the array using the site number.
  • Unbundle the Site Runtime Data cluster in LabVIEW or use the .NET properties and methods on the SiteRuntimeData object to obtain the following types of information about the site:
    • Start and end test times
    • Whether it is currently retesting or will retest the current part
    • Information about the current part
    • Wafer die coordinates
    • Hardware and software bin information the part will be assigned
  • In LabVIEW, use the Get Batch Runtime Data VI to obtain run-time data for the current batch. In .NET, access the BatchRuntimeData property on the Semiconductor Module Manager object.
  • Unbundle the Batch Runtime Data cluster in LabVIEW or use the .NET properties and methods on the BatchRuntimeData object to obtain the following types of information about the batch:
    • Start and end test times
    • Whether it is currently resting or will retest the current part
    • Whether this is the first or last batch in a wafer
    • The wafer run-time data
  • Obtain the run-time data for the current wafer by calling the Get Wafer Runtime Data VI or by accessing the WaferRuntimeData property of the BatchRuntimeData .NET property.
  • Use the values of the output terminals on the Get Wafer Runtime Data VI or use the .NET properties and methods of the WaferRuntimeData object to obtain the wafer ID and other information about the wafer.