Lot Summary Reports (TSM)

When testing completes, you can generate a test Lot Summary Report that provides information about testing results. You can enable the Lot Summary Report in the Results Processing dialog box. The Lot Summary Report includes the following sections:

• Lot Description Header—Contains lot and station settings information and execution data, such as start and end time, that describe or identify the test cell, test conditions, state of Offline Mode, and DUTs tested.
• Lot Results—Contains results of all DUTs from all sites, including the percent-of-total yield. The Lot Results section also includes subsections for all tests and Inline QA only (if available) tests. You can use this data as a metric to judge the overall quality of the test lot.
• Site Results—Contains a table of test lot statistics by site. You can use this data as a metric to compare the test quality among different sites.
• Software Bin Results—Contains a table of software bin numbers, associated hardware bin numbers, software bin descriptions, total counts, and percent-of-total yield. You can use this data to identify specific types of failures reported during testing.
• Hardware Bin Results—Contains a table of hardware bin numbers, hardware bin descriptions (if available), total counts, and percent-of-total yield. You can use this data to separate DUTs with different failure modes or passing grades and to reconcile tester software counts with physical DUT counts.
• Test Results—Contains a table of test evaluation results by site for all the tests that executed at least once in the lot, sorted by execution order. You can use this data to compare the results of lots, which can be helpful during debugging. If alarms are enabled, the table includes the number of alarms raised when executing each test step.
• Alarms—If alarms are enabled, this section contains a table with the number of alarms of a given type that were raised during test program execution, on each site, pin, and step.