GetReportFileName Callback (TSM)
- Updated2025-07-31
- 3 minute(s) read
The STDF Log, Lot Summary Report, CSV Test Results Log, and Debug Test Results Log result processing plug-ins determine the name of the report or data log file by calling the GetReportFileName callback sequence once for each active result processing plug-in instance. The STDF Log, CSV Test Results Log, and Lot Summary Report result processing plug-ins call the callback once per wafer when you enable the Generate One File per Wafer option. The GetReportFileName callback sequence is located in the <TestStand Public>\Components\Callbacks\NI_SemiconductorModule\SemiconductorModuleCallbacks.seq or <TestStand>\Components\Callbacks\NI_SemiconductorModule\SemiconductorModuleCallbacks.seq file.
The GetReportFileName callback sequence accepts the following parameters:
-
ModelPlugin [In] —An instance of the NI_ModelPlugin data type. Use the
Parameters.ModelPlugin.Base.SequenceFileName
property to determine which result processing plug-in called the
callback sequence. Possible values include the following:
- STDF Log: NI_SemiconductorModule_StdfGenerator.seq
- Lot Summary Report: NI_SemiconductorModule_LotSummaryReportGenerator.seq
- Debug Test Results Log: NI_SemiconductorModule_TestResultsLogGenerator.seq
- CSV Test Results Log: NI_SemiconductorModule_CSVTestResultsLogGenerator.seq
- ModelThreadType [In] —An instance of the NI_ModelThreadType data type. Use values in this container to determine whether the filename corresponds to a specific site or to all sites. For example, the STDF Log result processing plug-in creates a single file for all sites, and the Debug Test Results Log result processing plug-in calls the GetReportFileName callback once for each site to create a separate file for each site.
- ModelData [In] —Contains information about the process model used to test the current lot.
- LotSettings [In] —An instance of the NI_SemiconductorModule_LotSettings data type. Use values in this container to append lot settings, such as Standard.JobName and Standard.LotId, to the filename. The TSM result processing plug-ins call the GetReportFileName callback sequence after the ConfigureLotSettings and GetLotSettings callback sequences, which might have set values in this container.
- StationSettings [In] —An instance of the NI_SemiconductorModule_StationSettings data type. Use values in this container to append station settings, such as Standard.NodeName and Standard.TestFacilityId, to the filename. TSM result processing plug-ins call the GetReportFileName callback sequence after the ConfigureStationSettings and GetStationSettings callback sequences, which might have set values in this container.
- StartDate [In]—An instance of the DateDetails data type that represents the date that testing began. For the STDF Log and Lot Summary Report, this parameter contains the date that the current wafer started testing if the Generate One File per Wafer option is enabled. Use values in this container to append the lot test start date to the filename.
- StartTime [In]—An instance of the TimeDetails data type that represents the time that testing began. For the STDF Log and Lot Summary Report, this parameter contains the time that the current wafer started testing if the Generate One File per Wafer option is enabled. Use values in this container to append the lot test start time to the filename.
- ReportDestinationDirectory [In/Out]—Contains the report or data log file destination directory, which you configured in the related result processing plug-in Options dialog box. Change the value of this parameter to store the report or data log file in a different location.
- ReportFileName [Out]—The report or data log filename. TSM concatenates the values of the ReportDestinationDirectory and ReportFileName parameters to generate the report or data log file absolute path.
In addition to using the parameters to generate a report filename, you can use the TSM Application API in a code module the GetReportFilename callback sequence calls to access batch and site run-time data, including wafer information.
Related Information
- TestStand Directory Structure
- NI_ModelPlugin
- Process Model Thread Types
- NI_SemiconductorModule_LotSettings Data Type
- ConfigureLotSettings Callback (TSM)
- GetLotSettings Callback (TSM)
- NI_SemiconductorModule_StationSettings Data Type
- Configure Station Settings Dialog Box (TSM)
- GetStationSettings Callback (TSM)
- TSM Application API