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TestStand Semiconductor Module User Manual

Table of Contents
  • TestStand Semiconductor Module User Manual
  • TestStand Semiconductor Module
  • Installation Instructions
  • Licensing Options
  • TestStand Semiconductor Module New Features and Changes
  • Updates and Changes for TestStand Semiconductor Module Extended Support Versions
  • Getting Started with TSM
  • TSM Example Programs
  • Test Steps and Flow (TSM)
  • Test Settings Relationships (TSM)
  • Execution Timing Overview (TSM)
  • Recommended TSM Test Program Structure and Filenames
  • Mapping DUT Pins to Instrument Channels (TSM)
  • Binning DUTs Based on Test Results (TSM)
  • Specifications Files (TSM)
  • Digital Patterns (TSM)
  • Configuration Presets (TSM)
  • Testing Multiple Sites in Parallel (TSM)
  • Data Management Recommendations (TSM)
  • Code Module Development (TSM)
  • Exporting and Importing Test Limits with Text Files
  • Debugging
  • Using Environments in TSM
  • Offline Mode (TSM)
  • TSM Sequence Analyzer Rules Descriptions
  • Test Time Reduction and Test System Performance Improvements (TSM)
  • Performing Inline Quality Assurance Testing (TSM)
  • Part Average Testing (TSM)
  • Specifying Settings for the Current Test Station (TSM)
  • Specifying Settings for the Current Lot under Test (TSM)
  • Reports and Data Logs (TSM)
  • Configuring Handler or Prober Support for a Test Program (TSM)
  • Performing Tasks before Lot Testing Begins
  • Performing Tasks when Lot Testing Completes (TSM)
  • Retesting a DUT (TSM)
  • Deploying TSM Test Programs
  • Operator Interfaces (TSM)
  • Environment Reference
  • Glossary
  • TSM Application API
Table of Contents

Obtaining PAT Algorithm Settings at Run Time

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  • Updated2025-04-10
  • 1 minute(s) read
    • TestStand Semiconductor Module
    • User Manual

Use the PartAverageTestingAlgorithmSettings property on the SetupPartAverageTestingCallbackArgs parameter of the PAT Setup entry point sequence to obtain the values of PAT algorithm settings at run time. Refer to the IPartAverageTestingAlgorithmSettings interface in the TSM Application API for more information.

Parent topic: Part Average Testing Algorithm Settings (TSM)
Related concepts:
  • Part Average Testing Setup Entry Point (TSM)
  • TSM Application API
Related Information
  • Part Average Testing Setup Entry Point (TSM)
  • TSM Application API

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