The bin definitions XML schema, located at <TestStand>\Components\Schemas\NI_SemiconductorModule\BinDefinitions.xsd, defines the following structure for a bin definitions XML file:

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Root element>
Element
Attribute

BinDefinitions

• schemaVersion—Specifies the version of the schema file.
• softwareBinsOnlyMode—(Optional) Specifies whether the bin definitions editor displays only software bins and no hardware bins. The bin definitions editor sets this attribute when you enable the Software Bins Only option. This option can be useful when you perform wafer testing using software bins exclusively. When this attribute is True, the bin definitions editor ensures that a unique hardware bin exists for each software bin.
• HardwareBins—Specifies the hardware bins available to the handler or prober.
  • Bin—Specifies an individual hardware bin.
    • name—(Optional) A short descriptive name for the hardware bin. TSM stores the name in the Hardware Bin Record (HBR) of a Standard Test Data Format (STDF) log file.
    • number—A unique number the handler or prober uses to place the device under test (DUT). The number must be a valid 16-bit unsigned integer.
    • type—Specifies a value of Pass, Fail, or Other.
• SoftwareBins—Specifies the software bins to define for the test program.
  • errorBin—The software bin number TSM assigns to a DUT when the main test sequence errors. The software bin must be associated with a hardware bin of the Fail or Other type.
  • defaultFailBin—(Optional) The software bin number TSM assigns to a DUT when the main test sequence fails and a bin has not yet been assigned to the DUT. The software bin must be associated with a hardware bin of the Fail or Other type. You can omit the default fail bin from the bin definitions file. In this case, TSM uses the errorBin for the defaultFailBin.
  • defaultPassBin—The software bin number TSM assigns to a DUT when the main test sequence passes and a bin has not yet been assigned to the DUT. The software bin must be associated with a hardware bin of the Pass type.
  • Bin—Specifies an individual software bin.
    • name—(Optional) A short descriptive name for the software bin. The Semiconductor Multi Test step displays this name in the Software Bin column on the Tests tab when you select the software bin for a DUT. TSM stores the name in the Software Bin Record (SBR) of an STDF log file.
    • number—A unique number to identify the software bin. The number must be a valid 16-bit unsigned integer.
    • hardwareBin—The hardware bin number to associate with the software bin. The type of the software bin is inferred from the associated hardware bin. The Software Bin column on the Tests tab of the Semiconductor Multi Test step lists only software fail bins. TSM ensures that the test status of a DUT corresponds to the type of software bin assigned to the DUT. For example, TSM reports a run-time error if a test program causes TSM to assign a software pass bin to a failed DUT.