The PXI LCR Meter provides femtofarad-class capacitance measurements and femtoampere-class current measurements in a single-slot PXI form factor. Explore the feature set and performance capability of the PXI LCR Meter in this brief demonstration.
With an in-fab ATE based on PXI SMUs, IMEC cut costs by 75 percent and reduced their project cycle for wafer process flow testing from one month to just three days.
By applying foundational best practices, test engineers can improve DC measurement accuracy and product quality.
With NI’s PXIe-4190 LCR meter and SMU, a first-of-its-kind ultracompact instrument, engineers can conduct CV/IV measurements without switching connections at the device under test.
Explore a wide range of support content, including examples and troubleshooting information.