The Digital Pattern Editor is an interactive tool for importing, editing, or creating test patterns. The software integrates editing sheets for device pin maps, specifications, and patterns to develop or edit imported digital test vectors and patterns.
The Digital Pattern Editor includes tools like Schmoo plots to provide a deeper understanding of device-under-test (DUT) performance across variation. The editor also offers debugging tools such as overlaying pattern failures on a pattern or using digital scope for an analog view of the pin data.
The TestStand Semiconductor Module works in conjunction with the Digital Pattern Editor and NI-Digital Pattern Driver with native pin map support and multisite, DUT-centric programming of Semiconductor Test Systems (STSs).
Discover how the STS delivers the openness and flexibility of the PXI platform to the semiconductor production environment.
Fundamentals of Building a Test System
Defining a test strategy and planning system investments are critical to reducing cost, optimizing your test-investment life cycle, and maximizing efficiency. Learn test strategies, best practices, and design tradeoffs for your test systems.