Use the Digital Pattern Editor with a Digital Pattern Instrument and the NI-Digital Pattern Driver software for digital testing of semiconductors, or devices under test (DUTs).

Key Features

The following features set NI-Digital Pattern apart:
  • Intuitive interfaces for importing, editing, and creating test patterns.
  • Development tools to create test code and interact with digital pattern instruments in LabVIEW, C, or .NET.
  • Debugging tools for digital test patterns, such as overlaying pattern failures and digital scope.
  • Integrated editors to develop imported digital test vectors and patterns.
  • Support for native pin map and multisite, DUT-centric programming of Semiconductor Test Systems (STS).

Components of an NI-Digital Pattern System

The following figure displays the relationship between test programs, digital pattern project files, and test hardware.



This documentation assumes you are an experienced semiconductor test engineer familiar with the following:

  • Common semiconductor test program hardware and software components.
  • Digital pattern project components.
  • Programming in LabVIEW or Microsoft Visual Studio.

Supported Hardware

NI-Digital Pattern supports the following hardware models:
  • PXIe-6570
  • PXIe-6571