Updates and Changes for Digital Pattern Editor Extended Support Versions

Browse updates and changes made in Digital Pattern Editor versions on extended support.

Note If you cannot find changes for your version, it might be a more recent version, documented as a new feature. Or, your version might not have included user-facing updates. You can find more information about non-visible changes, such as bug fixes, compatibility updates, and stability adjustments or maintenance adjustments, in the product Release Notes, available on ni.com.

NI-Digital Pattern 2024 Q3 Changes

General updates to the Digital Pattern Editor:
  • View and clear NI-DCPower real-time alarms.
  • View memory use by patterns and loaded waveforms.
  • Added support for custom relays driven by NI-DAQmx digital lines.
  • Added new advanced SMU properties.
  • Added ability to detect SMU merged channels and prevent modification of secondary channels.
  • Show POGO connector information in tool tip and Digital Pattern Editor System View.
  • Added voltage and current ranges for the PXIe-4150.
  • Added DMM pins to Pin View pane

NI-Digital Pattern 2024 Q2 Changes

Hardware support for the following instrument model:
  • PXIe-6571 (8CH)
General updates to the Digital Pattern Editor System View:
  • View the time sets currently loaded on the digital instruments.
  • Support for MI & RF drivers to display NI-DMM, NI-SCOPE, NI-FGEN, NI-RF, and NI-DAQmx pins.
Updates to Digital Pattern Editor register maps:
  • Edit DUT register maps directly in the Digital Pattern Editor.
  • Use the Import Semiconductor Device Control register map command to import a Semiconductor Device Control (SDC) register map.
Updates to Digital Pattern Editor advanced debugging tools:
  • In System View, use the Go to InstrumentStudio command on source measure unit (SMU), data acquisition, digital multimeter, radio frequency (RF), oscilloscope, and waveform generator pins to launch InstrumentStudio. In InstrumentStudio, you can view, configure, monitor, and debug items such as pins, channels, or instruments.
  • In System View, use the Go to Pin View command on Digital and DCPower pins to navigate to the Pin View pane and configure that pin.
  • In Project Files View, use the Go to InstrumentStudio command on a pin map to launch InstrumentStudio configured for that pin map.

NI-Digital Pattern 2024 Q1 Changes

Updates to the Digital Pattern Editor:
  • In Pattern Grid View, delete multiple pin columns.
  • In Pattern Grid View, represent selected pin state cell values as numeric values.
  • In System View, apply relay configurations.
  • In various views, use the Open Pattern button next to the Pattern Name text box to open the pattern.
  • In a timing document, visually group time set rows.

NI-Digital Pattern 2023 Q4 Changes

Updates to the Digital Pattern Editor:
  • In Pattern Grid View, navigate using the Page Up and Page Down keys.
  • In Pattern Grid View, scroll pin and comment columns horizontally.
  • Update to the Find in Pattern dialog box to become non-modal.

NI-Digital Pattern 2023 Q2 Changes

NI-Digital Pattern 2023 Q2 is a maintenance release and does not include any new user-facing features or behavior changes.

NI-Digital Pattern 2023 Q1 Changes

  • Added support for LabVIEW 2023 and later.

NI-Digital Pattern 2022 Q4 Changes

NI-Digital Pattern 2022 Q4 includes only bug fixes. Refer to the NI-Digital Pattern Driver Release Notes for a list of bug fixes.

NI-Digital Pattern 21.8 Changes

Updates to the Digital Pattern Editor:
  • Improved performance for System View measurements.
  • Improved performance for creating DC-Power sessions.
  • In digital scope, halt pattern execution at a specified vector.
  • In Pattern Grid View, display the burst count.
  • Save shmoo test results to a text file.