To obtain the voltage of two DUTs using open circuit voltage (OCV) tests, run OCV Concurrent Sessions.vi.

You can run OCV tests with the same parameters on up to two DMMs simultaneously. Since each DMM has one channel, you can run up to two OCV tests in parallel.

Equipment

  • PXIe-4081 or PXI-4071
  1. Use the NI Example Finder to open OCV Concurrent Sessions.vi.
    1. In the LabVIEW window, select Help » Find Examples.
      The NI Example Finder window loads.
    2. Select Toolkits and Modules » Battery Cell Quality » OCV Concurrent Sessions.vi.
      The front panel of the VI loads.
  2. On the front panel of the VI, select two DMM resources from the Instrument Descriptor controls.
    Note NI supports the PXIe-4081 or PXI-4071 DMMs.
  3. Optional: If you want the DMMs to perform self-calibration, enable self-calibration on the front panel.
    Enable or disable self-calibration for each DMM running an EIS test.
  4. Configure OCV Test Parameters.
    1. Select a voltage Range.
      Select 10 V DC or 1000 V DC depending on which voltage range is compatible with your DUT.
    2. Select an Aperture Time (PLCs).
      The aperture time is related to power line cycles (PLCs) of the DMM. Higher PLCs increase the measurement quality. However, higher PLCs also increase the test time.
    3. Select the Number of Averages.
      The Number of Averages is the number of data points that are averaged in the test result. Higher Number of Averages increase the measurement quality. However, higher Number of Averages also increase the test time.
    4. Select the Powerline Frequency.
    5. Select whether the DMM performs ADC Calibration.
      Choice Description
      On The DMM performs analog-to-digital converter (ADC) calibration.
      Off The DMM does not perform ADC calibration.
      ADC calibration is separate from self-calibration.
  5. Switch to the front panel and click Run.
After running the VI, view the OCV result (in V) for both OCV tests on the front panel. In addition, dt shows the difference between the measurement times of the tests.