Running Multiple EIS Tests with Multiple SMUs Simultaneously
- Updated2026-01-28
- 2 minute(s) read
Running Multiple EIS Tests with Multiple SMUs Simultaneously
You can run EIS tests with the same parameters on up to four SMUs simultaneously. To create a Cole-Cole plot and view the results of multiple EIS tests, run the EIS Test Multi Session with Plot VI.
Equipment
- PXIe-4139 (40 W) or PXIe-4139 (20 W)
-
Use the NI Example Finder to open EIS Test Multi Session with Plot
VI.
-
In the LabVIEW window, select .
The NI Example Finder window loads.
-
Select .
The front panel of the VI loads.
-
In the LabVIEW window, select .
- On the front panel of the VI, select up to four SMUs from the HW Resource Name and Channels controls.
- Optional:
If you want the SMUs to perform self-calibration, enable self-calibration on the front
panel.
Enable or disable self-calibration for each SMU running an EIS test.Notice Before allowing self-calibration, NI recommends disconnecting the DUT. Self-calibrating a connected DUT may damage your equipment or lead to inaccurate data.
-
Enter EIS Test Parameters.
Option Description Enter test parameters on the front panel of the VI. - Configure the Frequency Sweep Characteristics. Each entry on the Frequency Sweep
Characteristics array defines the parameters that the VI uses to generate a sine
wave. Refer to Configuring the Frequency Sweep Characteristics for EIS
Measurements for more information about each parameter.
- Select the number of tests.
- Select the Frequency (Hz). The number of arrays you select limits the frequency.
- Select the Current Amplitude (A).
- Select the Number of Periods.
- Select the Voltage Limit Hi (V).
- Select the Nominal DUT Voltage (V).
- Select the Compensation Method.
- Select the Power Line Frequency.
Modify the block diagram of the EIS Test Multi Session with Plot VI to obtain test parameters using a configuration file. - Locate Obtain Test Parameters on the block diagram.
- Change the Test Parameters Source In enum to File.
- Right-click the file path (use dialog) path control and select Browse for Path.
- Navigate to the location for the configuration file you created and select the configuration file.
- Configure the Frequency Sweep Characteristics. Each entry on the Frequency Sweep
Characteristics array defines the parameters that the VI uses to generate a sine
wave. Refer to Configuring the Frequency Sweep Characteristics for EIS
Measurements for more information about each parameter.
- Click Run.
- The x-axis represents the real part of the impedance, which is the resistance.
- The y-axis represents the imaginary part of the impedance, which is the reactance.
Related Information
- Creating a Configuration File for Tests
Create a configuration file to set test parameters that you can use for multiple tests. You can use configuration files with EIS, ACIR, and OCV tests.
- Creating Compensation Values for a Test
Create compensation values to account for the impedance of cables, connectors, and other components in the measurement path. Create compensation values for EIS tests and ACIR tests.
- Configuring the Frequency Sweep Characteristics for EIS Measurements
For electrochemical impedance spectroscopy (EIS) measurements, configure frequency sweep characteristics.