NIDigitalPatternPinQueryContext Class
- Updated2026-06-25
- 1 minute(s) read
An object the GetNIDigitalPatternSessions method returns to track the sessions and channels associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and to extract data from a set of measurements.
Derives from
Syntax
Namespace: NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI
public class NIDigitalPatternPinQueryContext : MultiplePinMultipleSessionQueryContext
Methods
| Name | Description |
|---|---|
| PerInstrumentToPerSitePatternResults(bool) | Converts pattern results indexed by instrument session into per-site pattern results. |
| PerInstrumentToPerSiteWaveforms(uint) | Converts waveforms indexed by instrument into per-site data. |
| PerSiteToPerInstrumentWaveforms(uint) | Converts per-site waveform data into an array of waveforms indexed by instrument session. |
| PublishPatternResults(bool, string) | Publishes results from NI-Digital pattern burst to the Semiconductor Multi Test step for all sites in the SemiconductorModuleContext. Leave the Pin column blank for the test on the Semiconductor Multi Test step when publishing pattern results with this method. |
| PublishPatternResults(bool, NIDigitalHistoryRamCycleInformation[], string) | Publishes results from NI-Digital pattern burst to the Semiconductor Multi Test step for all sites in the SemiconductorModuleContext. Leave the Pin column blank for the test on the Semiconductor Multi Test step when publishing pattern results with this method. |