TestStand Semiconductor Module Code Module VIs Help
- Updated2024-02-02
- 3 minute(s) read
TestStand Semiconductor Module Code Module VIs Help
April 2022, 373951M-01
Use the TestStand Semiconductor Module™ (TSM) Code Module API to develop code modules to perform tests using DUT pin or pin group names. You can use this API to manage pins, instruments, sessions, sites, data, switching, specifications, and to publish measurement data.
The VIs on this palette return general LabVIEW error codes.
| Palette Object | Description |
|---|---|
| Get Pin Names | Returns all DUT and system pins available in the Semiconductor Module context that are connected to an instrument of the type you specify in the Instrument Type Id parameter. This VI returns only the pins specified on the Options tab of the Semiconductor Multi Test step. Pass an empty string to the Instrument Type Id parameter to return all available pins or pin groups. |
| Publish Data | Publishes measurement data for one or more pins to the Semiconductor Multi Test step type instances for all sites in the Semiconductor Module context. If you are publishing site data, the polymorphic instance must publish data for each site in the Semiconductor Module context. If you are publishing pin data, the polymorphic instance must support the pin query context obtained from the specific Pin(s) to Session(s), Pin to FPGA VI Reference(s), or Get Session Data VI you previously created. Pin(s) to Session(s) VIs include the following: |
| Pin Control | Use the pin control to create a control populated with the pins from a linked sequence file. This allows you to select a value from the control's populated list rather than entering the value as a string. If there is no sequence file linked to the LabVIEW project, or if you are editing the LabVIEW project on a system that cannot access the sequence file, the control acts as a string. |
| Published Data Id Control | Use the published data ID control to create a control populated with the published data IDs from a linked sequence file. This allows you to select a value from the control's populated list rather than entering the value as a string. If there is no sequence file linked to the LabVIEW project, or if you are editing the LabVIEW project on a system that cannot access the sequence file, the control acts as a string. |
| Subpalette | Description |
|---|---|
| NI-Digital Pattern VIs | Use the NI-Digital Pattern VIs to manage NI-Digital Pattern instruments and sessions, to manage NI-Digital Pattern waveform data, and to access digital pattern project files. |
| NI-DCPower VIs | Use the NI-DCPower VIs to manage NI-DCPower instruments and sessions. |
| NI-DAQmx VIs | Use the NI-DAQmx VIs to manage NI-DAQmx tasks. |
| NI-DMM VIs | Use the NI-DMM VIs to manage NI-DMM instruments and sessions. |
| NI-FGEN VIs | Use the NI-FGEN VIs to manage NI-FGEN instruments and sessions. |
| NI-SCOPE VIs | Use the NI-SCOPE VIs to manage NI-SCOPE instruments and sessions. |
| RF VIs | Use the NI-RFSA, NI-RFSG, NI-RFmx, NI-RFPM, and FPGA VIs to manage NI-RFSA, NI-RFSG, NI-RFPM, and RF RIO (RF LabVIEW FPGA enabled) instruments. |
| Model-Based Instrument VIs | Use Model-Based Instrument VIs to return the names, properties, and values of model-based instruments. |
| NI-HSDIO VIs | Use the NI-HSDIO VIs to manage NI-HSDIO instruments and sessions and to create and rearrange multisite digital waveforms. |
| Switching VIs | Use the Switching VIs to store and return switch sessions, return the names of all switches defined in the pin map, and access a switched pin. |
| Relay Driver VIs | Use the Relay Driver VIs to manage PXI-2567 relay driver modules and sessions and to switch relays. This palette also contains the relay and relay configuration controls, which you can use to create controls populated with the relays and relay configurations from a linked sequence file. |
| Custom Instrument VIs | Use the Custom Instruments VIs to manage custom instruments and sessions for instruments that TSM does not natively support. |
| Specifications VIs | Use the Specifications VIs to obtain resolved values defined in the specification file the test program specifies. This palette also contains the specification control, which you can use to create a control populated with the specifications from a linked sequence file. |
| Site and Global Data VIs | Use the Site and Global data VIs to manage site and global data |
| Advanced VIs | Use the Advanced VIs to query the site numbers in the Semiconductor Module context, return the status of the Offline Mode setting, and transform per-instrument to per-site data. This palette also contains the input data ID control, which you can use to create a control populated with the input data IDs from a linked sequence file. |