Advanced VIs (TSM)
- Updated2024-02-02
- 3 minute(s) read
Advanced VIs (TSM)
Use the Advanced VIs to query the site numbers in the Semiconductor Module context, return the status of the Offline Mode setting, and transform per-instrument to per-site data.
The VIs on this palette return general LabVIEW error codes.
| Palette Object | Description |
|---|---|
| Get Site Numbers | Returns the site numbers and number of sites in the Semiconductor Module context. |
| Get Session And Channel Index | Returns the index of the channel group and channel that corresponds to a pin query. Use this VI to access an individual pin when you take a measurement across multiple instruments and pins. When you call a pin query VI, such as the Pins to NI-HSDIO Sessions VI, the VI returns an array of sessions and a channel list. Use the Get Session and Channel Index VI to identify which session and which channel refers to a pin and site number you specify. |
| Get Input Data | Returns per-site input data as defined in the Semiconductor Multi Test step. You must manually select the polymorphic instance you want to use. |
| Filter Pins | Filters the pins by instrument type ID. Pass a list of all pins or pin groups to return the pins connected to instruments of the type you specify in the Instrument Type Id parameter. If no pins are connected to instruments of the type you specify in the Instrument Type Id parameter, this VI returns an empty array. |
| Extract Pin Data | Extracts the measurement data for a specified pin from measurements obtained from an instrument and arranges the data in the order of sites in the Semiconductor Module context. |
| Get Offline Mode | Returns the current status of the Offline Mode setting. Offline Mode allows you to detect if your test program is using simulated instruments in Offline Mode. |
| Get Pins In Pin Group(s) | Returns a list of pins contained in the pin group or list of pin groups you specify. You must manually select the polymorphic instance you want to use. |
| Get Relays In Relay Group(s) | Returns a list of relays contained in the relay group or list of relay groups you specify. You must manually select the polymorphic instance you want to use. |
| Get Site Semiconductor Module Contexts | Returns an array of Semiconductor Module context objects, each of which represents a single site. The size and ordering of the array match the size and ordering of the sites in the Semiconductor Module Context input. |
| Per-Instrument to Per-Site Data | Transforms the measurement data from measurements obtained from an instrument and arranges the data in the order of sites and pins in the Semiconductor Module context. Use this VI when you have raw measurement data from an instrument that you need to manipulate in a site-specific way. |
Input Data Id Control
The Advanced palette also contains the input data ID control, which you can use to create a control populated with the input data IDs from a linked sequence file. This allows you to select a value from the control's populated list rather than entering the value as a string. If there is no sequence file linked to the LabVIEW project, or if you are editing the LabVIEW project on a system that cannot access the sequence file, the control acts a string.
 |
Note To create a control, place it on the front panel. Placing a control on the block diagram creates a constant. |
| Palette Object | Description |
|---|---|
| Input Data Id | Contains a list of input data IDs for the linked sequence file(s). Displays only input data IDs on Semiconductor steps whose code module is set to the current VI. |