Publish Data (TSM)

Publish Data (TSM)

Requires: TSM

Publishes measurement data for one or more pins to the Semiconductor Multi Test step type instances for all sites in the Semiconductor Module context. If you are publishing site data, the polymorphic instance must publish data for each site in the Semiconductor Module context. If you are publishing pin data or pattern results, the polymorphic instance must support the pin query context obtained from the specific Pin(s) to Session(s), Pin to FPGA VI Reference(s), or Get Session Data VI you previously created. Pin(s) to Session(s) VIs include the following: Pin(s) to NI-Digital Pattern Sessions, Pin(s) to NI-DCPower Session(s), Pin(s) to NI-DAQmx Task(s), Pin(s) to NI-DMM Session(s), Pin(s) to NI-FGEN Session(s), Pin(s) to NI-SCOPE Session(s), Pin(s) to NI-HSDIO Session(s), Pin to NI-RFSA Session(s), Pin to NI-RFSG Session(s), and Pin to NI-RFmx Session(s).

Pin-Based:Pattern Results:2D Array

Publishes the results obtained from calls to the Get Site Pass Fail VI or the Burst Pattern VI of the NI-Digital Pattern instrument driver on multiple instrument sessions. Leave the Pin column blank for the test on the Semiconductor Multi Test step when publishing pattern results with this VI.

	Pin Query Context is the pin query context object that tracks the sessions and channels associated with a pin query. TSM uses this object to publish measurements and extract data from a set of measurements.
	History RAM Information is the History RAM information returned by the niDigital Fetch Multi-Site History RAM Information VI of the NI-Digital Pattern instrument driver after a pattern burst. The niDigital Fetch Multi-Site History RAM Information VI does not appear on the NI-Digital Pattern Driver palette. Browse to and select the VI from the NI-Digital Pattern Driver library file (niDigital.llb), located in the \instr.lib\niDigital directory.
	Pattern Results is the site pass/fail results returned by the Get Site Pass Fail VI or Burst Pattern VI of the NI-Digital Pattern instrument driver.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Published Data Id is the unique ID for distinguishing the measurement when you publish multiple measurements within the same code module.
	Pin Query Context Out returns the pin query context object unchanged.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

Pin-Based:Pattern Results:1D Array

Publishes the results obtained from calls to the Get Site Pass Fail VI or the Burst Pattern VI of the NI-Digital Pattern instrument driver on a single instrument session. Leave the Pin column blank for the test on the Semiconductor Multi Test step when publishing pattern results with this VI.

	Pin Query Context is the pin query context object that tracks the sessions and channels associated with a pin query. TSM uses this object to publish measurements and extract data from a set of measurements.
	History RAM Information is the History RAM information returned by the niDigital Fetch Multi-Site History RAM Information VI of the NI-Digital Pattern instrument driver after a pattern burst. The niDigital Fetch Multi-Site History RAM Information VI does not appear on the NI-Digital Pattern Driver palette. Browse to and select the VI from the NI-Digital Pattern Driver library file (niDigital.llb), located in the \instr.lib\niDigital directory.
	Pattern Results is the site pass/fail results returned by the Get Site Pass Fail VI or Burst Pattern VI of the NI-Digital Pattern instrument driver.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Published Data Id is the unique ID for distinguishing the measurement when you publish multiple measurements within the same code module.
	Pin Query Context Out returns the pin query context object unchanged.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

Pin-Based:Parametric:2D Array

Publishes numeric results or data from multiple sites for the Semiconductor Multi Test step to consume. Use this VI to publish data for multiple sites in the same order in which the sites are defined in the Semiconductor Module context.

	Pin Query Context is the pin query context object that tracks the sessions and channels associated with a pin query. TSM uses this object to publish measurements, and extract data from a set of measurements. You must create a pin query context object from a Pin(s) to Sessions VI.
	Data In specifies the multisite measurement data from multiple pins connected to multiple instrument sessions. Each row represents measurements from one instrument session, and each column represents each channel on that instrument session.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Published Data Id is the unique ID for distinguishing the measurement when you publish multiple measurements within the same code module.
	Pin Query Context Out returns the pin query context object unchanged.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

Pin-Based:Parametric:1D Array

Publishes numeric results or data from multiple sites for the Semiconductor Multi Test step to consume. Use this VI to publish data for multiple sites in the same order in which the sites are defined in the Semiconductor Module context.

	Pin Query Context is the pin query context object that tracks the sessions and channels associated with a pin query. TSM uses this object to publish measurements, and extract data from a set of measurements. You must create a pin query context object from a Pin(s) to Session(s) VI.
	Data In specifies the multisite measurement data from multiple pins connected to one or more instrument sessions. The array consists of either a collection of single measurements made from multiple instrument sessions or a collection of multiple measurements made from a single instrument session.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Published Data Id is the unique ID for distinguishing the measurement when you publish multiple measurements within the same code module.
	Pin Query Context Out returns the pin query context object unchanged.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

Pin-Based:Parametric:Scalar

Publishes numeric results or data from multiple sites for the Semiconductor Multi Test step to consume. Use this VI to publish data for multiple sites in the same order in which the sites are defined in the Semiconductor Module context.

	Pin Query Context is the pin query context object that tracks the sessions and channels associated with a pin query. TSM uses this object to publish measurements, and extract data from a set of measurements. You must create a pin query context object from a Pin to Session VI.
	Data In specifies the double measurement data for a single pin in a single site.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Published Data Id is the unique ID for distinguishing the measurement when you publish multiple measurements within the same code module.
	Pin Query Context Out returns the pin query context object unchanged.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

Pin-Based:Pass/Fail:2D Array

Publishes Boolean measurements from multiple sites for the Semiconductor Multi Test step to consume. Use this VI to publish data for multiple sites in the same order in which the sites are defined in the Semiconductor Module context.

	Pin Query Context is the pin query context object that tracks the sessions and channels associated with a pin query. TSM uses this object to publish measurements, and extract data from a set of measurements. You must create a pin query context object from a Pin(s) to Sessions VI.
	Data In specifies the multisite measurement data from multiple pins connected to multiple instrument sessions. Each row represents measurements from one instrument session, and each column represents each channel on that instrument session.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Published Data Id is the unique ID for distinguishing the measurement when you publish multiple measurements within the same code module.
	Pin Query Context Out returns the pin query context object unchanged.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

Pin-Based:Pass/Fail:1D Array

Publishes Boolean measurements from multiple sites for the Semiconductor Multi Test step to consume. Use this VI to publish data for multiple sites in the same order in which the sites are defined in the Semiconductor Module context.

	Pin Query Context is the pin query context object that tracks the sessions and channels associated with a pin query. TSM uses this object to publish measurements, and extract data from a set of measurements. You must create a pin query context object from a Pin(s) to Session(s) VI.
	Data In specifies the multisite measurement data from multiple pins connected to one or more instrument sessions. The array consists of either a collection of single measurements made from multiple instrument sessions or a collection of multiple measurements made from a single instrument session.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Published Data Id is the unique ID for distinguishing the measurement when you publish multiple measurements within the same code module.
	Pin Query Context Out returns the pin query context object unchanged.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

Pin-Based:Pass/Fail:Scalar

Publishes Boolean measurements from multiple sites for the Semiconductor Multi Test step to consume. Use this VI to publish data for multiple sites in the same order in which the sites are defined in the Semiconductor Module context.

	Pin Query Context is the pin query context object that tracks the sessions and channels associated with a pin query. TSM uses this object to publish measurements, and extract data from a set of measurements. You must create a pin query context object from a Pin to Session VI.
	Data In specifies the Boolean measurement data for a single pin in a single site.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Published Data Id is the unique ID for distinguishing the measurement when you publish multiple measurements within the same code module.
	Pin Query Context Out returns the pin query context object unchanged.
	error out Contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

Site-Based:N Sites:Numeric

Publishes double measurements from multiple sites for the Semiconductor Multi Test step to consume. Use this VI to publish data for multiple sites in the same order in which the sites are defined in the Semiconductor Module context.

	Semiconductor Module Context is a valid ActiveX reference to a Semiconductor Module context object.
	Pin is the name of the pin that corresponds to the Data In parameter.
	Data In specifies the double measurement data for all sites in the Semiconductor Module context. The number of elements in the array must be equal to the number of sites. You must return results in the same order as the sites in the Semiconductor Module context. Use the Get Site Numbers VI to obtain the list of site numbers.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Published Data Id is the unique ID for distinguishing the measurement when you publish multiple measurements within the same code module.
	Semiconductor Module Context Out returns the Semiconductor Module Context parameter unchanged.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

Site-Based:N Sites:Boolean

Publishes Boolean measurements from multiple sites for the Semiconductor Multi Test step to consume. Use this VI to publish data for multiple sites in the same order in which the sites are defined in the Semiconductor Module context.

	Semiconductor Module Context is a valid ActiveX reference to a Semiconductor Module context object.
	Pin is the name of the pin that corresponds to the Data In parameter.
	Data In specifies the Boolean measurement data for all sites in the Semiconductor Module context. The number of elements in the array must be equal to the number of sites. You must return results in the same order as the sites in the Semiconductor Module context. Use the Get Site Numbers VI to obtain the list of site numbers.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Published Data Id is the unique ID for distinguishing the measurement when you publish multiple measurements within the same code module.
	Semiconductor Module Context Out returns the Semiconductor Module Context parameter unchanged.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

Site-Based:N Sites:String

Publishes strings from multiple sites for the Semiconductor Multi Test step to consume. Use this VI to publish data for multiple sites in the same order in which the sites are defined in the Semiconductor Module context.

	Semiconductor Module Context is a valid ActiveX reference to a Semiconductor Module context object.
	Pin is the name of the pin that corresponds to the Data In parameter.
	Data In specifies strings for all sites in the Semiconductor Module context. The number of elements in the array must be equal to the number of sites. You must return results in the same order as the sites in the Semiconductor Module context. Use the Get Site Numbers VI to obtain the list of site numbers.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Published Data Id is the unique ID for distinguishing the measurement when you publish multiple measurements within the same code module.
	Semiconductor Module Context Out returns the Semiconductor Module Context parameter unchanged.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

Site-Based:1 Site:Numeric

Publishes a double measurement from a single site for the Semiconductor Multi Test step to consume. Use this VI to publish data for single site defined in the Semiconductor Module context. If the Semiconductor Module context contains more than one site, this VI returns an error.

	Semiconductor Module Context is a valid ActiveX reference to a Semiconductor Module context object.
	Pin is the name of the pin that corresponds to the Data In parameter.
	Data In specifies the double measurement data for a single site in the Semiconductor Module context.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Published Data Id is the unique ID for distinguishing the measurement when you publish multiple measurements within the same code module.
	Semiconductor Module Context Out returns the Semiconductor Module Context parameter unchanged.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

Site-Based:1 Site:Boolean

Publishes a Boolean measurement from a single site for the Semiconductor Multi Test step to consume. Use this VI to publish data for single site defined in the Semiconductor Module context. If the Semiconductor Module context contains more than one site, this VI returns an error.

	Semiconductor Module Context is a valid ActiveX reference to a Semiconductor Module context object.
	Pin is the name of the pin that corresponds to the Data In parameter.
	Data In specifies the Boolean measurement data for a single site in the Semiconductor Module context.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Published Data Id is the unique ID for distinguishing the measurement when you publish multiple measurements within the same code module.
	Semiconductor Module Context Out returns the Semiconductor Module Context parameter unchanged.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

Site-Based:1 Site:String

Publishes a string measurement from a single site for the Semiconductor Multi Test step to consume. Use this VI to publish data for single site defined in the Semiconductor Module context. If the Semiconductor Module context contains more than one site, this VI returns an error.

	Semiconductor Module Context is a valid ActiveX reference to a Semiconductor Module context object.
	Pin is the name of the pin that corresponds to the Data In parameter.
	Data In specifies the string measurement data for a single site in the Semiconductor Module context.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Published Data Id is the unique ID for distinguishing the measurement when you publish multiple measurements within the same code module.
	Semiconductor Module Context Out returns the Semiconductor Module Context parameter unchanged.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.