Controlling Digital Communication Values During Test Execution

If a test automation program reaches a breakpoint while the corresponding Semiconductor Device Control Add-On large panel is open, you can use the large panel to edit register, field, and DIO pin values at that point in the program. After you finish editing these values, you can resume test program execution.

Before you begin this procedure, insert a breakpoint at the point in your program where you intend to change the digital communication value of the register, field, or DIO pin.

Complete the following steps to edit register, field, and DIO pin values at a breakpoint in a monitored test automation program.

  1. Run the test automation program and monitor the program execution in the Semiconductor Device Control Add-On. Refer to Monitoring a Test Automation Program section for more information about monitoring program execution.
  2. Wait for the test automation program to reach the break point you set previously.
  3. After the program reaches the breakpoint, click Control to enable editing of register, field, and DIO pin values and to enable script execution.
  4. Update the values of registers, fields, and DIO pins as needed.
  5. Click Monitor to disable editing of registers, fields, and DIO pins, and resume test program execution.
    Notice If you resume test program execution while the large panel is in control mode, you can edit the controls on the large panel while the test program executes. Click Monitor before resuming the test automation program to prevent unintentional edits to register, field, and DIO pin values.