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STS is a turnkey ATE solution that delivers cost-optimized lab-quality test at speed for RF, mixed signal, and MEMS semiconductor devices.
Optimize Test at Volume
Improve Throughput and Repeatability
Shorten Time to Market
Simplify Mechanical Integration
Each NI STS configuration features interchangeable device interface boards for scalable pin-count and site-count requirements and is available in three model sizes, ranging from ultra-compact to high-volume.
Tailor your RF ATE to the production test needs of your portfolio, including integrated antenna modules, filters, amplifiers, and more.
Optimize your mixed-signal ATE to the production test needs of your portfolio, including data converters, linear analog components, communication interfaces, and more.
Customize your microelectromechanical systems (MEMS) ATE to the production test needs of your portfolio, including sensors and actuators.
Our other business units already adopted STS…their recommendations convinced our RF business to try it out for a massive MIMO application. I’m very pleased by the progress…higher throughput means more devices shipped faster, which means business results.
Executive VP of Global Operations
NXP
Let's Talk About Other Production Test Options
To learn more about NI Semiconductor Test Solutions, talk to our technical experts.
Get a comprehensive suite of applications and drivers to develop, deploy, debug, optimize, and calibrate production test systems. Streamline test program generation, boost parallel test efficiency, and customize operator interfaces, all while ensuring system version consistency.
Use AI-based analytics software that collects, cleans, and analyzes data from multiple manufacturing and enterprise data sources to optimize all product lifecycle stages. With advanced analytics, discover how to minimize product variation and improve yield.
We provide comprehensive engineering services and specialized hardware programs designed to meet the critical uptime requirements of semiconductor test applications. These solutions help maximize efficiency, improve tester performance, and extend system longevity. With every STS deployment, we partner with you to determine the level of service that best meets your application needs and ensures long-term success.
PXI source measure units (SMUs) combine high-precision source and measure capability with features designed to reduce test time and increase flexibility.
PXI digital pattern instruments deliver ATE-class digital to the industry-standard PXI platform. They are designed for testing a broad range of RF and mixed-signal ICs.
Vector signal transceivers (VSTs) combine a vector signal generator, vector signal analyzer, and user-programmable FPGA into one device. Use these products for RF and wireless applications such as cellular device testing and RFIC characterization.