Test Code Module Development with STS Course Overview
The Test Program Development with STS course prepares you to use a Semiconductor Test System (STS) to communicate with a device under test. The course follows the typical semiconductor test workflow and milestones. After completing this course, a test engineer will be able to create, modify, execute, and debug test programs with pre-existing code modules (developed using LabVIEW or .NET/C#) to collect test data and test time reports.
Available formats
Course Objectives
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Develop custom code modules
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Debug code modules
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Implement multisite subsystem execution
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Implement test program optimization
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Reduce test time
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Deploy test programs
Course Details
Duration
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On-Demand: 10 hours
Audience
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Semiconductor test developers using or evaluating the NI STS to develop and perform semiconductor production test or high-volume automated device validation
Prerequisites
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General knowledge of semiconductor test strategies and methods
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Test Program Development with STS Course
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Experience in .NET/C# code development in Microsoft Visual Studio
NI Products Used
If you take the course On-Demand:
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STS Software Bundle v24.5.1
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NI STS T1 M2
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STS T1 DX Training DIB
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ADS7229
Training Materials
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On-demand training includes digital course materials delivered through the NI Learning Center, available for the access duration of your subscription
Cost in Credits
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On-Demand: Included with enterprise agreements, or 5 Education Services Credits, or 2 Training Credits
Test Code Module Development with STS Course Outline
| Lesson | Overview | Topics |
|---|---|---|
| NI STS Overview | Explore the different types of software and environments used to configure and develop test programs for the STS. |
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| Switching Between Versions of STS Software | Use the STS Version Selector to switch between installed versions of STS software. |
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| Semiconductor Module Context and TSM API Overview | Explore the TSM Code Module API to develop code modules to perform tests using DUT pin or pin group names. |
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NI Instrument APIs Overview (LabVIEW) | Explore the NI Instrument APIs that developers use to create applications for the instruments. |
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| Introduction to the Semiconductor Test Library (.NET/C#) | Develop STS test programs with .NET/C# efficiently using the Semiconductor Test Library. |
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Exploring the Project Creation Templates
| Learn how to use the Semiconductor Test Library in new projects, review the LabVIEW project template. |
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Exploring the Help Files
| Launch and explore the help documentation for the STS and its instruments. |
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| Instrument Programming Overview | Explore the general programming flow and the types of instruments in STS. |
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| Programming DCPower Instruments in STS | Programmatically control and configure the DCPower instruments in STS. |
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| Programming Digital Pattern Instruments in STS | Programmatically control and configure the Digital Pattern Instruments in STS. |
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| Exploring the Use of Other Instruments in STS | Explore using supported, not yet supported, and custom instruments in STS. |
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| Building Your Code Modules | Tips and tools for the effective usage of the code module development environment. |
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| Communicating with a DUT | Select the appropriate control method and protocol for your DUT and use it to ensure connectivity before running the test code modules. |
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| Debugging the Test Program | Use TestStand, .NET, and LabVIEW debugging tools to debug the test program and test code modules. |
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| Performing Inline Quality Assurance Testing | Integrate inline quality assurance (QA) tests into a test sequence to ensure the quality and consistency of the test application and its code modules. |
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| Assigning Software Bins to a DUT | Create and use software bins to sort tested DUTs beyond pass, fail, or error results. |
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| Getting and Storing Test Information | Obtain the values for lot settings, station settings, STS test head state, execution data, and custom test conditions, and store that data to make it accessible for your test steps. |
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| Executing Tests Using the Batch Process Model | Describe how TSM uses the Batch process model for multi-threaded execution. |
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| Developing Test Programs for Multisite Execution | Identify and implement the subsystem execution model for a multisite test. |
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| Exploring Test Time Reduction Techniques | Explore the tools and techniques for test system performance profiling and test time reduction (TTR). |
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Benchmarking a Test System
| Explore the Test Program Analyzer to evaluate the performance of the test program. |
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| Low-Level Test Step Benchmarking | View and record the duration of steps, code modules, and other resources of the test program. |
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| Deploying an STS Test Program | Define a deployment process, deploy the test program, and debug it after deployment. |
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| Debugging Deployed Test Programs | Debug a test program in production by switching from the Operator Interface to the engineering environment. |
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Continue Your Learning Path
RF IC Test with STS and .NET/C#
This course targets RF systems based on the STS-5531. For test engineers testing RF parts, use STS RF resources interactively to create, modify, execute, and debug test programs based on RF configurations.
RF Test with STS
This course targets RF systems based on the STS RF Silo. The RF Test with STS course follows the typical customer workflow and milestones, which includes tight interaction with standard STS RF hardware.
Device Testing with Digital Pattern Instruments
Leverage digital pattern instruments and the Digital Pattern Editor to perform common characterization and production tests, with a focus on DUT communication, digital interface testing, and continuity and leakage testing.
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