RF Test with STS Course Overview
The RF Test with STS course follows the typical customer workflow and milestones, which includes tight interaction with standard STS RF hardware. After completing this course, an RF test developer will be able to use STS RF resources interactively to create, modify, execute, and debug test programs based on RF configurations. This course builds upon the fundamental STS knowledge covered in the Test Program Development with STS and Test Code Module Development with STS and .NET/C# courses.
Available formats
Virtual training not available for this course
Classroom training not available for this course
Private Classes not available for this course
Course Objectives
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Recognize the components, functionality and purpose of the STS RF subsystem
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Connect to the RF DUT test it for continuity
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Use the Semiconductor Test Automation Framework (STAF) to create an RF STS project
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Use InstrumentStudio and trace viewers to monitor and debug an RF STS project
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Use test time reduction (TTR) techniques to improve RF test system performance
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Follow best practices for releasing the RF STS program for production
Course Details
Duration
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On-Demand: 4.5 hours
Audience
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Semiconductor test developers using or evaluating the standard RF NI Semiconductor Test System (STS) to develop and perform tests for RF ICs
Prerequisites
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General knowledge of semiconductor test strategies and methods
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Test Program Development with STS course
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Test Code Module Development with STS and .NET/C# course
NI Products Used
If you take the course On-Demand:
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Semiconductor Test System (STS)
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STS Software Bundle 25.0
Training Materials
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On-demand training includes digital course materials delivered through the NI Learning Center, available for the access duration of your subscription
Cost in Credits
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On-Demand: Included with software subscription and enterprise agreements, or 5 Education Services Credits, or 2 Training Credits
RF Test with STS Course Outline
| Lesson | Overview | Topics |
|---|---|---|
| Exploring RF STS Hardware | Identify the components of the STS RF subsystem and their functionality. |
|
| Introduction to Calibrating your RF STS | Identify the main categories of RF STS calibration and explore the details of performing test head calibration. |
|
| Exploring the RF DUT | Explore the RF device under test (DUT) and device interface board (DIB) that interfaces between the DUT and the instruments of the STS. |
|
| Connecting the RF DUT to the Tester | Use DUT setup documentation to create a pin map to enable test and measurement software to identify the connections between DUT pins and instruments in the STS. |
|
| Bringing Up the RF DUT | Use instruments within the STS to power on the DUT and perform continuity tests on DUT pins. |
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| DUT-Level Calibration Workflows and Tools | Extend system calibration up to the DUT to ensure the accuracy of your test measurements. |
|
| Exploring the Process for Creating an RF STS Test Program | Explain the purpose of the Semiconductor Test Automation Framework and learn the high-level workflow for creating a new RF STS test sequence. |
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| Exploring the Components of the STAF | Identify the various components of the STAF and explain their purpose in the creation of an RF STS test program. |
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| Creating a New RF IC Test Sequence | Use the components of the STAF and the TSRU to create a new RF STS test sequence. |
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| Debugging with InstrumentStudio | Review fundamental STS debugging techniques and explore the use of InstrumentStudio to debug RF instruments. |
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| Debugging with Trace Viewers | Review the use of the Runtime Data Viewer and explore the use of Trace Viewers to debug your RF STS test programs. |
|
| Reducing RF STS Test Time | Review general STS test time reduction techniques and investigate techniques specific to RF STS testing. |
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| Releasing the RF STS Test Program for Production | Perform tasks to facilitate releasing the test program for the production environment. |
|
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