Table Of Contents

VCSEL I-V Test Subsystem

Last Modified: January 13, 2021

The VCSEL I-V Test Subsystem provides a customizable solution to high-speed pulse testing on vertical-cavity surface-emitting laser (VCSEL) DUTs individually or testing on up to four VCSEL DUTs in parallel.

Finding Documentation for the VCSEL I-V Test Subsystem

The content throughout this manual applies to all VCSEL I-V Test Subsystem options unless otherwise noted.

Content applies to the VCSEL I-V Test PXI Subsystem.

Content applies to the VCSEL I-V Test MXI Subsystem.

Use the links in the following table to view the available online documentation for the VCSEL I-V Test Subsystem.

Document Contents
VCSEL I-V Test Subsystem User Manual
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Note  

Visit ni.com/r/vcsel-user-manual to view and download the VCSEL I-V Test Subsystem User Manual as a PDF.

  • Subsystem overview
  • Subsystem set up procedures
  • Load board design guidelines
  • Subsystem specifications
  • Hardware and software reference
VCSEL I-V Test Software Help
  • API reference
  • Example information
VCSEL I-V Test Software Readme
  • Software requirements and compatible versions
  • Software installation instructions
  • Installed software locations

Finding Documentation for Instrumentation

Use the following links to find documentation for the instrumentation used with the VCSEL I-V Test Subsystem, including getting started guides, specifications, and online help.

Downloading Software

Use the following links to download the required software for use with the VCSEL I-V Test Subsystem. Refer to the VCSEL I-V Test Software Readme for a list of compatible software versions.


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