VCSEL I-V Test Subsystem

The VCSEL I-V Test Subsystem provides a customizable solution to high-speed pulse testing on vertical-cavity surface-emitting laser (VCSEL) DUTs individually or testing on up to four VCSEL DUTs in parallel.

Finding Documentation for the VCSEL I-V Test Subsystem

The content throughout this manual applies to all VCSEL I-V Test Subsystem options unless otherwise noted.

	Content applies to the VCSEL I-V Test PXI Subsystem.
	Content applies to the VCSEL I-V Test MXI Subsystem.

Use the links in the following table to view the available online documentation for the VCSEL I-V Test Subsystem.

Document	Contents
VCSEL I-V Test Subsystem User Manual Note   Visit ni.com/r/vcsel-user-manual to view and download the VCSEL I-V Test Subsystem User Manual as a PDF.	Subsystem overview Subsystem set up procedures Load board design guidelines Subsystem specifications Hardware and software reference
VCSEL I-V Test Software Help	API reference Example information
VCSEL I-V Test Software Readme	Software requirements and compatible versions Software installation instructions Installed software locations

Finding Documentation for Instrumentation

Use the following links to find documentation for the instrumentation used with the VCSEL I-V Test Subsystem, including getting started guides, specifications, and online help.

• NI-4134 Pulse Generator
• PXIe-4135 Source Measure Unit (SMU)
• PXIe-5162 Oscilloscope
• PXIe-1092 Chassis
• PXIe-8880 Controller
• MXI-Express Gen 3 x16 System
  • PCIe-8398 Host Interface Card
  • PXIe-8398 Remote Control Module

Downloading Software

Use the following links to download the required software for use with the VCSEL I-V Test Subsystem. Refer to the VCSEL I-V Test Software Readme for a list of compatible software versions.

• LabVIEW
• VCSEL I-V Test Software
• NI-DCPower
• NI-SCOPE
• PXI Platform Services