Table Of Contents

Instrument Settings Pane

Last Modified: November 23, 2020

Select Instrument Settings»History RAM and Signal Settings to launch the Instrument Settings pane.

History RAM Setup

Configure the following options for bursting a pattern and logging History RAM results to display. Refer to the specifications document for the digital pattern instrument for more information about the number of samples supported in History RAM.

  • Trigger on — Specifies the conditions on which to begin logging results to History RAM.
    • Failure — Begins logging History RAM results on the first cycle that fails. This is the default value.
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      Note  

      The editor logs failures on a per-site and per-instrument basis, returning only partial results for a site that spans multiple digital pattern instruments where not all instruments for a site had History RAM results logged for the same cycles. When an instrument does not include all pins of a site and no History RAM results exist for those pins and cycles on another digital pattern instrument in the active pin and channel map, those pin state data cells are indicated with an asterisk in the History RAM View.

    • Cycle — Begins logging History RAM results starting with the cycle you specify.
      • Cycle — Specifies the cycle number on which to trigger.
    • Global Label + Offsets — Specifies to begin logging History RAM results at a particular global label with a cycle offset or a vector offset from the label that you specify.
      • Label or Pattern — Specifies the global label at which to start logging History RAM results. A global label is a label that a pattern exports. All pattern names are also global labels for the first vector of the pattern.
      • Vector Offset — Specifies the number of vectors to offset from the label or pattern before logging History RAM results.
      • Cycle Offset — Specifies the number of cycles to offset from the label or pattern before logging History RAM results.
  • Pretrigger Samples — Specifies the number of samples to log before the Trigger on event occurs. The default value is 0.
  • Stop — Specifies the condition on which to stop logging results to History RAM.
    • When Full — Stops logging History RAM results when the History RAM is full and discards any additional results after the History RAM is full. This is the default value.
    • After X Samples — Stops logging History RAM results when the number of samples you specify have been logged.
      • X — Specifies the number of samples to log.
  • Cycles to Capture — Specifies the cycles to log when the Trigger on event occurs.
    • Failures Only — Logs only cycles with a failure. This is the default value.
    • All — Logs all cycles.

Export Pattern Opcode Event Signals

You can route up to four events to any of the eight PXI chassis backplane trigger lines per digital pattern instrument based on the signal opcodes you use in a pattern.

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Note  

PXI trigger lines are system-wide resources that other instruments in the test system can use or reserve. When you export pattern opcode events to these output terminals, ensure that another instrument is not using or has not reserved the PXI trigger line.

Assign Pattern Opcode Conditional Jump Triggers

Configure each digital pattern instrument or group of digital pattern instruments to conditionally jump on a specified trigger. The conditional jump triggers can be software signals or PXI trigger lines.

The Instrument or Group drop-down menu displays one of the following options:

  • The name of a single, unsynchronized instrument.
  • The group name for an instrument or group of instruments. Specify a group name for one or more instruments in the Pin Map Editor.
  • The chassis name for a set of instruments synchronized through the DPE’s Synchronized > Yes menu option and not specified as a group in the Pin Map Editor.

Frequency Counter

Configure the frequency counter and enable hysteresis for digital pattern instruments. The Measurement Mode drop-down displays the following options:

Option Description Hysteresis supported?
Banked Frequency measurements are made serially for groups of channels associated with a single frequency counter for each group. No
Parallel Frequency measurements are made by multiple frequency counters in parallel. Yes
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Note  

Frequency counter hysteresis filters out noise by requiring the corresponding rising and falling edges of a signal to pass through both Vol and Voh in the correct order.


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